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(Color online) RHEED intensity oscillations as a function of growth time for a 25 u.c. LCO film. Insets include structural models of orthorhombic and pseudocubic LCO, typical RHEED patterns for an LCO film and a starting STO substrate, and a typical AFM image and line scan for a LCO film.
(Color online) Non-aligned RBS for a 25 u.c. LCO film using a 2 MeV He ion beam with the incident beam oriented 7° off normal and a scattering angle of 150°. Insets—the Cr peak (squares) along with a family of simulations for Cr percentages ranging from 17 to 23 at. % (left) and a least-squares fit of these simulations to the Cr feature (right).
(Color online) Measured and simulated XRD 2θ−ω scan for the (002) reflection for 500 Å LCO/STO(001). Inset—(002) rocking curves for the same 500 Å LCO film.
(Color online) Cr 2p XPS spectra for an as-grown (red), oxygen plasma treated (blue), and vacuum annealed (green) LCO film. Insets show the corresponding RHEED and AFM images for the film during different stages of this redox process.
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