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(Color online) Experimental setup used for z-scan measurements. OPA: optical parametric amplifier, LPF: long pass filter, Det: detector, Att: neutral density filter, and Pol: crossed polarizers.
(Color online) Z-scan transmission traces for 460 μm thick Si at 2598 nm for peak intensities of 27 GW/cm2 and 139 GW/cm2. Solid dots show the experimental data and the thin solid lines are best fits based on a numerical fit to Eq. (2) for 3PA, and an analytical solution fit to Eq. (3) for n2.
(Color online) Measured n2 (triangles) and γ (circles) values for 460μm thick intrinsic silicon sample as a function of wavelength.
(Color online) n2 values obtained from the fits to experimental data (triangles), 3PA (circles) as a function of peak intensity at 2598 nm. Dashed line is theoretical fit based on 3PA.
(Color online) Nonlinear figure of merit for region with TPA: squares (data from Ref. 6) and region with 3PA: circles (measured data).
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