Full text loading...
(Color online) (a) An HR-XRD 2θ-θ scan for a BiFeO3 (B) and CoFe2O4 (C) composite film on MgAl2O4 (001) (S). The inset shows a magnified figure around (002) reflections of the substrate and the film. (b), (c), and (d) φ scans of the BiFeO3 (101), CoFe2O4 (202), and MgAl2O4 (202) reflections, respectively. (e) An HR-XRD reciprocal space map about the (226) reflections of the substrate (S) and the composite film of CoFe2O4 (C) and BiFeO3 (B).
(Color online) Magnetization vs. magnetic field curves of a 400 nm thick BiFeO3-CoFe2O4 composite film. The magnetic field is applied parallel (blue line) and perpendicular to the surface (red triangles).
(Color online) (a) A 3 × 3 μm2 AFM image of a 400 nm thick BiFeO3-CoFe2O4 composite film, (b) topography line profile along the line shown in (a). (c) Amplitude and (d) phase of piezoforce response of the same area shown in (a) measured simultaneously.
(Color online) (a) A 1.2 × 2 μm2 planar view TEM image showing a nanogrid structure of a 400 nm thick BiFeO3-CoFe2O4 composite film. (b) A 0.6 × 1 μm2 planar view TEM image of the same film. (c) An EDS spectrum measured around the linear mound marked by the solid red circle in (b). (d) An EDS spectrum measured around the matrix region marked by the dashed blue circle in (b). * and # symbols indicate the M α and L α spectral lines of Bi, respectively.
Article metrics loading...