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Volume 106, Issue 8, 23 February 2015

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FEATURED ARTICLE
  • Probing patterned defects on graphene using differential interference contrast observation
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38d913362403a4a254fa758cb6527ba5 journal.issuezxybnytfddd
Scitation: Applied Physics Letters - Browse
http://aip.metastore.ingenta.com/content/aip/journal/apl/106/8
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