Skip to main content

News about Scitation

In December 2016 Scitation will launch with a new design, enhanced navigation and a much improved user experience.

To ensure a smooth transition, from today, we are temporarily stopping new account registration and single article purchases. If you already have an account you can continue to use the site as normal.

For help or more information please visit our FAQs.

banner image
No data available.
Please log in to see this content.
You have no subscription access to this content.
No metrics data to plot.
The attempt to load metrics for this article has failed.
The attempt to plot a graph for these metrics has failed.
The full text of this article is not currently available.
1. R. Waser, R. Dittmann, G. Staikov, and K. Szot, Adv. Mater. 21, 2632 (2009).
2. R. Waser and M. Aono, Nature Mater. 6, 833 (2007).
3. D. B. Strukov, G. S. Snider, D. R. Stewart, and R. S. Williams, Nature (London) 453, 80 (2008).
4. M. Sowinska, T. Bertaud, D. Walczyk, S. Thiess, M. A. Schubert, M. Lukosius, W. Drube, C. Walczyk, and T. Schroeder, Appl. Phys. Lett. 100, 233509 (2012).
5. J. P. Strachan, M. D. Pickett, J. J. Yang, S. Aloni, A. L. David Kilcoyne, G. Medeiros-Ribeiro, and R. Stanley Williams, Adv. Mater. 22, 3573 (2010).
6. C. Lenser, A. Kuzmin, J. Purans, A. Kalinko, R. Waser, and R. Dittmann, J. Appl. Phys. 111, 076101 (2012).
7. K. Szot, W. Speier, G. Bihlmayer, and R. Waser, Nature Mater. 5, 312 (2006).
8. J. P. Strachan, J. J. Yang, R. Münstermann, A. Scholl, G. Medeiros-Ribeiro, D. R. Stewart, and R. S. Williams, Nanotechnology 20, 485701 (2009).
9. R. Dittmann, R. Muenstermann, I. Krug, D. Park, T. Menke, J. Mayer, A. Besmehn, F. Kronast, C. M. Schneider, and R. Waser, Proc. IEEE 100, 1979 (2012).
10. R. Muenstermann, T. Menke, R. Dittmann, and R. Waser, Adv. Mater. 22, 4819 (2010).
11. P. Guttmann, C. Bittencourt, S. Rehbein, P. Umek, X. Ke, G. Van Tendeloo, C. P. Ewels, and G. Schneider, Nat. Photonics 6, 25 (2012).
12. J. P. Strachan, G. Medeiros-Ribeiro, J. J. Yang, M.-X. Zhang, F. Miao, I. Goldfarb, M. Holt, V. Rose, and R. S. Williams, Appl. Phys. Lett. 98, 242114 (2011).
13. D. J. Keeble, S. Wicklein, L. Jin, C. L. Jia, W. Egger, and R. Dittmann, Phys. Rev. B 87, 195409 (2013).
14. D. J. Keeble, S. Wicklein, R. Dittmann, L. Ravelli, R. A. Mackie, and W. Egger, Phys. Rev. Lett. 105, 226102 (2010).
15.See supplementary material at for details on PLD growth parameters and sample preparation. [Supplementary Material]
16. S. Amelinckx, Handbook of Microscopy: Applications (VCH, 1997).
17. L. Pellegrino, M. Biasotti, E. Bellingeri, C. Bernini, A. S. Siri, and D. Marré, Adv. Mater. 21, 2377 (2009).
18. D. Weber, R. Vöfély, Y. Chen, Y. Mourzina, and U. Poppe, Thin Solid Films 533, 43 (2013).
19. X. D. Wu, S. R. Foltyn, R. C. Dye, Y. Coulter, and R. E. Muenchausen, Appl. Phys. Lett. 62, 2434 (1993).
20. C. Lenser, Z. Connell, A. Kovács, R. Dunin-Borkowski, A. Köhl, R. Waser, and R. Dittmann, Appl. Phys. Lett. 102, 183504 (2013).
21. A. Koehl, D. Kajewski, J. Kubacki, C. Lenser, R. Dittmann, P. Meuffels, K. Szot, R. Waser, and J. Szade, Phys. Chem. Chem. Phys. 15, 8311 (2013).
22. M. Abbate, F. M. F. de Groot, J. C. Fuggle, A. Fujimori, Y. Tokura, Y. Fujishima, O. Strebel, M. Domke, G. Kaindl, J. van Elp, B. T. Thole, G. A. Sawatzky, M. Sacchi, and N. Tsuda, Phys. Rev. B 44, 5419 (1991).
23. F. M. F. de Groot, J. C. Fuggle, B. T. Thole, and G. A. Sawatzky, Phys. Rev. B 41, 928 (1990).
24. P. Krüger, Phys. Rev. B 81, 125121 (2010).
25. F. M. F. de Groot, J. C. Fuggle, B. T. Thole, and G. A. Sawatzky, Phys. Rev. B 42, 5459 (1990).
26. A. Ohtomo, D. A. Muller, J. L. Grazul, and H. Y. Hwang, Nature (London) 419, 378 (2002).
27. D. A. Muller, N. Nakagawa, A. Ohtomo, J. L. Grazul, and H. Y. Hwang, Nature (London) 430, 657 (2004).
28. J.-S. Lee, Y. W. Xie, H. K. Sato, C. Bell, Y. Hikita, H. Y. Hwang, and C.-C. Kao, Nature Mater. 12, 703 (2013).
29. E. O. Filatova, A. A. Sokolov, Y. V. Egorova, A. S. Konashuk, O. Y. Vilkov, M. Gorgoi, and A. A. Pavlychev, J. Appl. Phys. 113, 224301 (2013).
30. V. E. Alexandrov, E. A. Kotomin, J. Maier, and R. A. Evarestov, Eur. Phys. J. B 72, 53 (2009).
31. G. van der Laan and I. W. Kirkman, J. Phys. Condens. Matter 4, 4189 (1992).
32. F. M. F. de Groot, M. O. Figueiredo, M. J. Basto, M. Abbate, H. Petersen, and J. C. Fuggle, Phys. Chem. Miner. 19, 140 (1992).
33. S. Menzel, B. Klopstra, C. Kügeler, U. Böttger, G. Staikov, and R. Waser, MRS Proceedings 1160, 1160H09 (2009).
34. K. Szot, M. Rogala, W. Speier, Z. Klusek, A. Besmehn, and R. Waser, Nanotechnology 22, 254001 (2011).
35. D.-H. Kwon, K. M. Kim, J. H. Jang, J. M. Jeon, M. H. Lee, G. H. Kim, X.-S. Li, G.-S. Park, B. Lee, S. Han, M. Kim, and C. S. Hwang, Nat. Nanotechnol. 5, 148 (2010).
36. S. O. Kucheyev, T. van Buuren, T. F. Baumann, J. H. Satcher, T. M. Willey, R. W. Meulenberg, T. E. Felter, J. F. Poco, S. A. Gammon, and L. J. Terminello, Phys. Rev. B 69, 245102 (2004).
37. E. Stoyanov, F. Langenhorst, and G. Steinle-Neumann, Am. Mineral. 92, 577 (2007).

Data & Media loading...


Article metrics loading...



Transmission X-ray microscopy is employed to detect nanoscale valence changes in resistive switching SrTiO thin film devices. By recording Ti L-edge spectra of samples in different resistive states, we could show that some spots with slightly distorted structure and a small reduction to Ti3+ are already present in the virgin films. In the ON-state, these spots are further reduced to Ti3+ to different degrees while the remaining film persists in the Ti4+ configuration. These observations are consistent with a self-accelerating reduction within pre-reduced extended growth defects.


Full text loading...


Access Key

  • FFree Content
  • OAOpen Access Content
  • SSubscribed Content
  • TFree Trial Content
752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd