Skip to main content

News about Scitation

In December 2016 Scitation will launch with a new design, enhanced navigation and a much improved user experience.

To ensure a smooth transition, from today, we are temporarily stopping new account registration and single article purchases. If you already have an account you can continue to use the site as normal.

For help or more information please visit our FAQs.

banner image
No data available.
Please log in to see this content.
You have no subscription access to this content.
No metrics data to plot.
The attempt to load metrics for this article has failed.
The attempt to plot a graph for these metrics has failed.
The full text of this article is not currently available.
/content/aip/journal/aplmater/1/4/10.1063/1.4824041
1.
1. O. Khaselev and J. Turner, Science 280, 425 (1998).
http://dx.doi.org/10.1126/science.280.5362.425
2.
2. T. Bak, J. Nowotny, M. Rekas, and C. C. Sorrell, Int. J. Hydrogen Energy 27, 991 (2002).
http://dx.doi.org/10.1016/S0360-3199(02)00022-8
3.
3. K. Sayama, A. Nomura, T. Arai, T. Sugita, R. Abe, M. Yanagida, T. Oi, Y. Iwasaki, Y. Abe, and H. Sugihara, J. Phys. Chem. B 110, 11352 (2006).
http://dx.doi.org/10.1021/jp057539+
4.
4. A. Kudo, K. Omori, and H. Kato, J. Am. Chem. Soc. 121, 11459 (1999).
http://dx.doi.org/10.1021/ja992541y
5.
5. S. Tokunaga, H. Kato, and A. Kudo, Chem. Mater. 13, 4624 (2001).
http://dx.doi.org/10.1021/cm0103390
6.
6. M. W. Stoltzfus, P. M. Woodward, R. Seshadri, J.-H. Klepeis, and B. Bursten, Inorg. Chem. 46, 3839 (2007).
http://dx.doi.org/10.1021/ic061157g
7.
7. H. M. Zhang, J. B. Liu, H. Wang, W. X. Zhang, and H. Yan, J. Nanopart. Res. 10, 767 (2008).
http://dx.doi.org/10.1007/s11051-007-9310-y
8.
8. H. Luo, A. Mueller, T. McCleskey, A. Burrell, E. Bauer, and Q. Jia, J. Phys. Chem. C 112, 6099 (2008).
http://dx.doi.org/10.1021/jp7113187
9.
9. A. Walsh, Y. Yan, M. N. Huda, M. M. Al-Jassim, and S.-H. Wei, Chem. Mater. 21, 547 (2009).
http://dx.doi.org/10.1021/cm802894z
10.
10. D. J. Payne, M. D. M. Robinson, R. G. Egdell, A. Walsh, J. McNulty, K. E. Smith, and L. F. J. Piper, Appl. Phys. Lett. 98, 212110 (2011).
http://dx.doi.org/10.1063/1.3593012
11.
11. Y. Hu, D. Li, Y. Zheng, W. Chen, Y. He, Y. Shao, X. Fu, and G. Xiao, Appl. Catal., B 104, 30 (2011).
http://dx.doi.org/10.1016/j.apcatb.2011.02.031
12.
12. W. J. Jo, J.-W. Jang, K.-J. Kong, H. J. Kang, J. Y. Kim, H. Jun, K. P. S. Parmar, and J. S. Lee, Angew. Chem., Int. Ed. 51, 3147 (2012).
http://dx.doi.org/10.1002/anie.201108276
13.
13. J. A. Seabold and K.-S. Choi, J. Am. Chem. Soc. 134, 2186 (2012).
http://dx.doi.org/10.1021/ja209001d
14.
14. J. D. Bierlein and A. W. Sleight, Solid State Commun. 16, 69 (1975).
http://dx.doi.org/10.1016/0038-1098(75)90791-7
15.
15. M. Zhou, S. Zhang, Y. Sun, C. Wu, M. Wang, and Y. Xie, Chem. Asian J. 5, 2515 (2010).
http://dx.doi.org/10.1002/asia.201000452
16.
16. M. Zhou, J. Bao, W. Bi, Y. Zeng, R. Zhu, M. Tao, and Y. Xie, ChemSusChem 5, 1420 (2012).
http://dx.doi.org/10.1002/cssc.201200287
17.
17. Q. Jia, K. Iwashina, and A. Kudo, Proc. Natl. Acad. Sci. U.S.A. 109, 11564 (2012).
http://dx.doi.org/10.1073/pnas.1204623109
18.
18. A. W. Sleight, H. Y. Chen, A. Ferretti, and D. E. Cox, Mater. Res. Bull. 14, 1571 (1979).
http://dx.doi.org/10.1016/0025-5408(72)90227-9
19.
19. Z. Zhao, Z. Li, and Z. Zou, Phys. Chem. Chem. Phys. 13, 4746 (2011).
http://dx.doi.org/10.1039/c0cp01871f
20.
20. S. Migita, Y. Kasai, H. Ota, and S. Sakai, Appl. Phys. Lett. 71, 3712 (1997).
http://dx.doi.org/10.1063/1.120490
21.
21. C. D. Theis, J. Yeh, D. G. Schlom, M. E. Hawley, G. W. Brown, J. C. Jiang, and X. Q. Pan, Appl. Phys. Lett. 72, 2817 (1998).
http://dx.doi.org/10.1063/1.121468
22.
22. J. F. Ihlefeld, A. Kumar, V. Gopalan, D. G. Schlom, Y. B. Chen, X. Q. Pan, T. Heeg, J. Schubert, X. Ke, P. Schiffer, J. Orenstein, L. W. Martin, Y. H. Chu, and R. Ramesh, Appl. Phys. Lett. 91, 071922 (2007).
http://dx.doi.org/10.1063/1.2767771
23.
23.See supplementary material at http://dx.doi.org/10.1063/1.4824041 for depictions of the crystal structure of the film and substrate, air SEM analysis from which fractional coverage was estimated, and x-ray spectroscopy results confirming bonding states of film atoms. [Supplementary Material]
24.
24.Calculated by interpolation (assuming Vegard's law) from the cubic lattice constants of YSZ with 9 and 10 mol% Y2O3 reported by M. Yashima, S. Sasaki, M. Kakihana, Y. Yamaguchi, H. Arashi, and M. Yoshimura, Acta Crystallogr., Sect. B 50, 663 (1994).
http://dx.doi.org/10.1107/S0108768194006257
25.
25.Calculated by interpolating the thermal expansion data for YSZ reported by J. W. Adams, H. H. Nakamura, R. P. Ingel, and R. W. Rice, J. Am. Ceram. Soc. 68, C228 (1985).
http://dx.doi.org/10.1111/j.1151-2916.1985.tb15793.x
26.
26. R. L. Frost, D. A. Henry, M. L. Weier, and W. Martens, J. Raman Spectrosc. 37, 722732 (2006).
http://dx.doi.org/10.1002/jrs.1499
27.
27. M. Gotic, S. Music, M. Ivanda, M. Soufek, and S. Popovic, J. Mol. Struct. 744–747, 535 (2005).
http://dx.doi.org/10.1016/j.molstruc.2004.10.075
28.
28. J. Cai, C. Raptis, Y. S. Raptis, and E. Anastassakis, Phys. Rev. B 51, 201 (1995).
http://dx.doi.org/10.1103/PhysRevB.51.201
29.
29. J. Lee, P. I. Rovira, I. An, and R. W. Collins, Rev. Sci. Instrum. 69, 1800 (1998).
http://dx.doi.org/10.1063/1.1148844
30.
30. B. Johs, J. A. Woollam, C. M. Herzinger, J. Hilfiker, R. Synowicki, and C. L. Bungay, in Critical Reviews of Optical Science and Technology, Optical Metrology, edited by G. A. Al-Jumaily (SPIE Publishing, Bellingham, WA, 1999), Vol. CR72, pp. 2958.
31.
31. Y. Cong, I. An, K. Vedam, and R. W. Collins, Appl. Opt. 30, 2692 (1991).
http://dx.doi.org/10.1364/AO.30.002692
32.
32. H. Fujiwara, J. Koh, P. I. Rovira, and R. W. Collins, Phys. Rev. B 61, 10832 (2000).
http://dx.doi.org/10.1103/PhysRevB.61.10832
33.
33. R. W. Collins and A. S. Ferlauto, in Handbook of Ellipsometry, edited by H. G. Tompkins and E. A. Irene (William Andrew, Norwich, NY, 2005), pp. 125129.
34.
34. D. E. Aspnes, in Handbook on Semiconductors, edited by M. Balkanski (North Holland, Amsterdam NL, 1980), Vol. 2, pp. 125127.
35.
35. J. I. Pankov, Optical Processes in Semiconductors (Dover, New York, 1975), p. 37.
36.
36.L. F. Kourkoutis, Y. Hotta, T. Susaki, H. Y. Hwang, and D. A. Muller, Phys. Rev. Lett. 97, 256803 (2006).
http://dx.doi.org/10.1103/PhysRevLett.97.256803
http://aip.metastore.ingenta.com/content/aip/journal/aplmater/1/4/10.1063/1.4824041
Loading
/content/aip/journal/aplmater/1/4/10.1063/1.4824041
Loading

Data & Media loading...

Loading

Article metrics loading...

/content/aip/journal/aplmater/1/4/10.1063/1.4824041
2013-10-11
2016-12-08

Abstract

Single-phase epitaxial films of the monoclinic polymorph of BiVO were synthesized by reactive molecular-beam epitaxy under adsorption-controlled conditions. The BiVO films were grown on (001) yttria-stabilized cubic zirconia (YSZ) substrates. Four-circle x-ray diffraction, scanning transmission electron microscopy (STEM), and Raman spectroscopy confirm the epitaxial growth of monoclinic BiVO with an atomically abrupt interface and orientation relationship (001) ∥ (001) with [100] ∥ [100]. Spectroscopic ellipsometry, STEM electron energy loss spectroscopy (STEM-EELS), and x-ray absorption spectroscopy indicate that the films have a direct band gap of 2.5 ± 0.1 eV.

Loading

Full text loading...

/deliver/fulltext/aip/journal/aplmater/1/4/1.4824041.html;jsessionid=RQFcDySZ96dJB4-R99p9Pk8T.x-aip-live-03?itemId=/content/aip/journal/aplmater/1/4/10.1063/1.4824041&mimeType=html&fmt=ahah&containerItemId=content/aip/journal/aplmater
true
true

Access Key

  • FFree Content
  • OAOpen Access Content
  • SSubscribed Content
  • TFree Trial Content
752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
/content/realmedia?fmt=ahah&adPositionList=
&advertTargetUrl=//oascentral.aip.org/RealMedia/ads/&sitePageValue=APLMaterials.aip.org/1/4/10.1063/1.4824041&pageURL=http://scitation.aip.org/content/aip/journal/aplmater/1/4/10.1063/1.4824041'
Top,Right1,Right2,Right3,