Skip to main content

News about Scitation

In December 2016 Scitation will launch with a new design, enhanced navigation and a much improved user experience.

To ensure a smooth transition, from today, we are temporarily stopping new account registration and single article purchases. If you already have an account you can continue to use the site as normal.

For help or more information please visit our FAQs.

banner image
No data available.
Please log in to see this content.
You have no subscription access to this content.
No metrics data to plot.
The attempt to load metrics for this article has failed.
The attempt to plot a graph for these metrics has failed.
The full text of this article is not currently available.
1. H. Suzuki, N. Inaoka, M. Mori, H. Takabatake, and A. Suzuki, Proc. IEEE Eng. Med. Biol. Soc. 1, 404 (1988).
2. G. Antoch, J. Stattaus, A. T. Nemat, S. Marnitz, T. Beyer, H. Kuehl, A. Bockisch, J. F. Debatin, and L. S. Freudenberg, Radiology 229, 526 (2003).
3. L. J. Meng, Z. He, B. Alexander, and J. Sandoval, IEEE Trans. Nucl. Sci. 53, 1706 (2006).
4. B. Benetti and W. G. J. Langeveld, Proc. SPIE 8852, 88520G (2013).
5. T. Defraeye, W. Aregawi, S. Saneinejad, P. Vontobel, E. Lehmann, J. Carmeliet, P. Verboven, D. Derome, and B. Nicolaï, Food Bioprocess Technol. 6, 3353 (2013).
6. D. S. Husseya, K. J. Coakleyb, E. Baltica, and D. L. Jacobsona, Nucl. Instrum. Methods Phys. Res. A 729, 316 (2013).
7. R. M. Latini, A. V. B. Bellido, U. M. Vinagre Filho, M. I. S. Souza, I. Lima, D. F. Oliveira, and R. T. Lopes, AIP Conf. Proc. 1529, 49 (2013).
8. Neutron Radiography, edited by J. P. Barton and P. Von Der Hardt(D. Reidel Publishing Company, Dordrecht 1983).
9. J. A. Harvey and N. W. Hill, Nucl. Instrum. Methods 162, 507 (1979).
10. B. W. Robertson, S. Adenwalla, A. Harken, P. Welsch, J. I. Brand, and P. A. Dowben, Appl. Phys. Lett. 80, 3644 (2002).
11. A. N. Caruso, P. A. Dowben, S. Balkir, N. Schemm, K. Osberg, R. W. Fairchild, O. B. Flores, S. Balaz, A. D. Harken, B. W. Robertson, and J. I. Brand, Mater. Sci. Eng. B 135, 129 (2006).
12. D. S. McGregor, S. L. Bellinger, and J. K. Shultis, J. Cryst. Growth 379, 99 (2013).
13. P. D. Hardt and H. Rotger, Neutron Radiography Handbook (D. Reidel Publishing Company, Dordrecht, 1981).
14. C. H. Wei, Z. Y. Xie, J. H. Edgar, K. C. Zeng, J. Y. Lin, H. X. Jiang, J. Chaudhuri, C. Ignatiev, and D. N. Braski, J. Electron. Mater. 29, 452 (2000).
15. G. Orsal, N. Maloufi, S. Gautier, M. Alnot, A. A. Sirenko, M. Bouchaour, and A. Ougazzaden, J. Cryst. Growth 310, 5058 (2008).
16. S. Nakamura, T. Mukai, and M. Senoh, Appl. Phys. Lett. 64, 1687 (1994).
17. H. Amano, M. Kito, K. Hiramatsu, and I. Akasaki, Jpn. J. Appl. Phys. 28, L2112 (1989).
18. S. Nakamura, M. Senoh, S. Nagahama, N. Iwasa, T. Yamada, T. Matsushita, H. Kiyoku, and Y. Sugimoto, J. Appl. Phys. Lett. 35, L74 (1996).
19. Y. Fujita, Y. Takano, Y. Inoue, M. Sumiya, S. Fuke, and T. Nakano, Jpn. J. Appl. Phys. 52, 08JB26 (2013).
20. M. Sumiya, Y. Kamo, N. Ohashi, M. Takeguchi, Y. U. Heo, H. Yoshikawa, S. Ueda, K. Kobayashi, T. Nihashi, M. Hagino, T. Nakano, and S. Fuke, Appl. Surf. Sci. 256, 4442 (2010).
21. H. Matsumura, Y. Kanematsu, T. Shimura, T. Tamaki, Y. Ozeki, K. Itoh, M. Sumiya, T. Nakano, and S. Fuke, Appl. Phys. Express 2, 101001 (2009).
22. S. Gautier, C. Sartel, S. Ould Saad Hamady, N. Maloufi, J. Martin, F. Jomard, and A. Ougazzaden, Superlattices Microstruct. 40, 233 (2006).
23. A. Ougazzaden, S. Gautier, C. Sartel, N. Maloufi, J. Martin, and F. Jomard, J. Cryst. Growth 298, 316 (2007).
24. S. Gautier, G. Patriarche, T. Moudakir, M. Abid, G. Orsal, K. Pantzas, D. Troadec, A. Soltani, L. Largeau, O. Mauguin, and A. Ougazzaden, J. Cryst. Growth 315, 288 (2011).
25. T. Honda, M. Shibata, M. Kurimoto, M. Tsubamoto, J. Yamamoto, and H. Kawanishi, J. Lumin. 87–89, 1274 (2000).
26. T. Honda, M. Shibata, M. Kurimoto, M. Tsubamoto, J. Yamamoto, and H. Kawanishi, J. Appl. Phys. 39, 2389 (2000).
27. T. Baghdadli, S. Ould Saad Hamady, S. Gautier, T. Moudakir, B. Benyoucef, and A. Ougazzaden, Phys. Status Solidi C 6, S1029 (2009).
28. A. Ougazzaden, S. Gautier, T. Moudakir, Z. Djebbour, Z. Lochner, S. Choi, H. J. Kim, J. H. Ryou, R. D. Dupuis, and A. A. Sirenko, Appl. Phys. Lett. 93, 083118 (2008).
29. H. Miyake, A. Motogaito, and K. Hiramatsu, Jpn. J. Appl. Phys. 38, L1000 (1999).

Data & Media loading...


Article metrics loading...



In this study, we developed a new neutron-detection device using a boron gallium nitride (BGaN) semiconductor in which the B atom acts as a neutron converter. BGaN and gallium nitride (GaN) samples were grown by metal organic vapor phase epitaxy, and their radiation detection properties were evaluated. GaN exhibited good sensitivity to α-rays but poor sensitivity to γ-rays. Moreover, we confirmed that electrons were generated in the depletion layer under neutron irradiation. This resulted in a neutron-detection signal after α-rays were generated by the capture of neutrons by the B atoms. These results prove that BGaN is useful as a neutron-detecting semiconductor material.


Full text loading...


Access Key

  • FFree Content
  • OAOpen Access Content
  • SSubscribed Content
  • TFree Trial Content
752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd