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1. L. Esaki, R. B. Laibowitz, and P. J. Stiles, IBM Tech. Discl. Bull. 13, 2161 (1971).
2. P. W. M. Blom, R. M. Wolf, J. F. M. Cillessen, and M. P. C. M. Krijn, Phys. Rev. Lett. 73, 2107 (1994).
3. J. F. Scott and C. A. Paz de Araujo, Science 246, 1400 (1989).
4. V. Garcia, S. Fusil, K. Bouzehouane, S. Enouz-Vedrenne, N. D. Mathur, A. Barthelemy, and M. Bibes, Nature (London) 460, 81 (2009).
5. D. S. Jeong, R. Thomas, R. S. Katiyar, J. F. Scott, H. Kohlstedt, A. Petraru, and C. Seong Hwang, Rep. Prog. Phys. 75, 076502 (2012).
6. Y. Watanabe, Phys. Rev. B 59, 11257 (1999).
7. M. Singh and U. Mishra, J. Appl. Phys. 91, 2989 (2002).
8. A. Q. Jiang, C. Wang, K. J. Jin, X. B. Liu, J. F. Scott, C. S. Hwang, T. A. Tang, H. Bin Lu, and G. Z. Yang, Adv. Mater. 23, 1277 (2011).
9. J. Rodriguez Contreras, H. Kohlstedt, U. Poppe, R. Waser, C. Buchal, and N. A. Perstev, Appl. Phys. Lett. 83, 4595 (2003).
10. C.-H. Yang, J. Seidel, S. Y. Kim, P. B. Rossen, P. Yu, M. Gajek, Y. H. Chu, L. W. Martin, M. B. Holcomb, Q. He, P. Maksymovych, N. Balke, S. V. Kalinin, A. P. Baddorf, S. R. Basu, M. L. Scullin, and R. Ramesh, Nat. Mater. 8, 485 (2009).
11. T. Choi, Y. J. Choi, V. Kiryukhin, and S.-W. Cheong, Science 324, 63 (2009).
12. C. Wang, K. J. Jin, Z. T. Xu, L. Wang, C. Ge, H. B. Lu, H. Z. Guo, M. He, and G. Z. Yang, App. Phys. Lett. 98, 192901 (2011).
13. A. Tsurumaki, H. Yamada, and A. Sawa, Adv. Funct. Mater. 22, 1040 (2012).
14. A. Sawa, Mater. Today 11, 28 (2008).
15. X. Chen, H. Zhang, K. Ruan, W. Shi, J. Alloy Compd. 529, 108 (2012);
15.X. Chen, G. Wu, H. Zhang, N. Qin, T. Wang, F. Wang,W. Shi, and D. Bao, Appl. Phys. A 100, 987 (2010).
16. J. E. Rault, W. Ren, S. Prosandeev, S. Lisenkov, D. Sando, S. Fusil, M. Bibes, A. Barthelemy, L. Bellaiche, and N. Barrett, Phys. Rev. Lett. 109, 267601 (2012).
17. X. Liu, Y. Wamg, J. D. Burton, and E. Y. Tsymbal, Phys. Rev. B 88, 165139 (2013).
18. S. Hong, T. Choi, J. H. Jeon, Y. Kim, H. Lee, H-Y Joo, I. Hwang, J.-S. Kim, S-O Kang, S. V. Kalinin, and B. H. Park, Adv. Mater. 25, 2339 (2013).
19. W. Kaenzig, Phys. Rev. 98, 549 (1955).
20. L. Pintillie and M. Alexe, J. Appl. Phys. 98, 124103 (2005).
21. L. Pintillie, I. Boerasu, M. J. M. Gomes, T. Zhao, R. Ramesh, and M. Alexe, J. Appl. Phys. 98, 124104 (2005).
22. L. Pintiliie, C. Dragoi, Y. H. Chu, L. W. Martin, R. Ramesh, and M. Alexe, Appl. Phys. Lett. 94, 232902 (2009).
23. W. Wu, J. R. Guest, Y. Horibe, S. Park, T. Choi, S.-W. Cheong, and M. Bode, Phys. Rev. Lett. 104, 217601 (2010).
24. D. Lee, D. Lee, S. H. Baek, T. H. Kim, J.-G. Yoon, C. M. Folkman, C. B. Eom, and T. W. Noh, Phys. Rev. B 84, 125305 (2011).
25. M. Stengel, P. Aguado-Puente, N. A. Spaldin and J. Jun-quera, Phys. Rev. B. 83, 235112 (2011);
25.C. Lichten-steiger, P. Zubko, M. Stengel, P. Aguado-Puente, J-M. Triscone, P. Ghosez, and J. Junquera, in Oxide Ultra-Thin Films: Science and Technology, edited by G. Pacchioni and S. Valeri (Wiley-VCH, 2012), Chap. 12.
26. L.-W. Chang, M. Alexe, J. F. Scott, and J. M. Gregg, Adv. Mater. 21, 4911 (2009).
27. A. K. Tagantsev and G. Guerra, J. Appl. Phys. 100, 051607 (2006).
28. M. Stengel, D. Vanderbilt, and N. A. Spaldin, Nat. Mater. 8, 392 (2009).
29. E. Y. Tsymbal, A. Gruverman, V. Garcia, M. Bibes, and A. Barthelemy, MRS Bull. 37, 138 (2012).
30. M. Bibes, J. E. Villegas, A. Barthelemy, Adv. Phys. 60, 5 (2011).
31. H. Kohlstedt, N. A. Pertsev, J. Rodriguez Contreras, and R. Waser, Phys. Rev. B 72, 125341 (2005).
32. J. Junquera and P. Ghosez, Nature (London) 422, 506, (2003).
33. G. Gerra, A. K. Tagantsev and N. Setter, Phys. Rev. Lett. 98, 207601 (2007).
34. M. Y. Zhuravlev, R. F. Sabirianov, S. S. Jaswal, and E. Y. Tsymbal, Phys. Rev. Lett. 94, 246802 (2005);
34.E. Tsymbal and H. Kohlstedt, Science 313, 181 (2006).
35. Y. Guo, B. Guo, W. Dong, H. Li, and H. Liu, Nanotechnology 24, 275201 (2013).
36. S. Farokhipoor and B. Noheda, Phys. Rev. Lett. 107, 127601 (2011);
36.S. Farokhipoor and B. Noheda, J. Appl. Phys. 112, 052003 (2012).
37. C. J. M. Daumont, S. Farokhipoor, A. Ferri, J. C. Wojdel, J. iguez, B. J. Kooi, and B. Noheda, Phys. Rev. B 81, 144115 (2010).
38. S. Hiboux and P. Muralt, Integr. Ferroelectr. 36, 83 (2001).
39. J. G. Simmons, Phys. Rev. Lett. 15, 967 (1965).
40. S. M. Sze and K. NG. Kwok, Physics of Semiconductor Devices, 3th ed. (Wiley-Interscience, New Jersey, 2007).
41. M. Dawber, J. F. Scott, and A. J. Hartmann, J. Eur. Ceram. Soc. 21, 1633 (2001).
42. S. J. Clark and J. Robertson, Appl. Phys. Lett. 90, 132903 (2007).
43. H. Liu, P. Yang, K. Yao, and J. Wang, Appl. Phys. Lett. 96, 012901 (2010).

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We investigate ferroelectric resistive switching in BiFeO thin films by performing local conductivity measurements. By comparing conduction characteristics at artificially up-polarized domains with those at as-grown down-polarized domains, the change in resistance is attributed to the modification of the electronic barrier height at the interface with the electrodes, upon the reversal of the electrical polarization. We also study the effect of oxygen vacancies on the observed conduction and we propose the existence of a different screening mechanism for up and down polarized domains.


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