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Topological crystalline insulator PbxSn1-xTe thin films on SrTiO3 (001) with tunable Fermi levels
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/content/aip/journal/aplmater/2/5/10.1063/1.4876637
2014-05-15
2014-12-21

Abstract

In this letter, we report a systematic study of topological crystalline insulator Pb SnTe (0 < x < 1) thin films grown by molecular beam epitaxy on SrTiO(001). Two domains of Pb SnTe thin films with intersecting angle of α ≈ 45° were confirmed by reflection high energy diffraction, scanning tunneling microscopy, and angle-resolved photoemission spectroscopy (ARPES). ARPES study of Pb SnTe thin films demonstrated that the Fermi level of PbTe could be tuned by altering the temperature of substrate whereas SnTe cannot. An M-shaped valance band structure was observed only in SnTe but PbTe is in a topological trivial state with a large gap. In addition, co-evaporation of SnTe and PbTe results in an equivalent variation of Pb concentration as well as the Fermi level of Pb SnTe thin films.

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Scitation: Topological crystalline insulator PbxSn1-xTe thin films on SrTiO3 (001) with tunable Fermi levels
http://aip.metastore.ingenta.com/content/aip/journal/aplmater/2/5/10.1063/1.4876637
10.1063/1.4876637
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