Skip to main content

News about Scitation

In December 2016 Scitation will launch with a new design, enhanced navigation and a much improved user experience.

To ensure a smooth transition, from today, we are temporarily stopping new account registration and single article purchases. If you already have an account you can continue to use the site as normal.

For help or more information please visit our FAQs.

banner image
No data available.
Please log in to see this content.
You have no subscription access to this content.
No metrics data to plot.
The attempt to load metrics for this article has failed.
The attempt to plot a graph for these metrics has failed.
The full text of this article is not currently available.
1. B. Radisavljevic, A. Radenovic, J. Brivio, V. Giacometti, and A. Kis, Nat. Nanotechnol. 6, 147 (2011).
2. H. Li, Z. Yin, Q. He, H. Li, X. Huang, G. Lu, D. W. H. Fam, A. I. Y. Tok, Q. Zhang, and H. Zhang, Small 8, 63 (2012).
3. W. Liu, J. Kang, D. Sarkar, Y. Khatami, D. Jena, and K. Banerjee, Nano Lett. 13, 1983 (2013).
4. H. Schmidt, S. Wang, L. Chu, M. Toh, R. Kumar, W. Zhao, A. H. C. Neto, J. Martin, S. Adam, B. Özyilmaz, and G. Eda, Nano Lett. 14, 1909 (2014).
5. K. F. Mak, C. Lee, J. Hone, J. Shan, and T. F. Heinz, Phys. Rev. Lett. 105, 136805 (2010).
6. B. W. H. Baugher, H. O. H. Churchill, Y. Yang, and P. Jarillo-Herrero, Nat. Nanotechnol. 9, 262 (2014).
7. C. R. Zhu, G. Wang, B. L. Liu, X. Marie, X. F. Qiao, X. Zhang, X. X. Wu, H. Fan, P. H. Tan, T. Amand, and B. Urbaszek, Phys. Rev. B 88, 121301 (2013).
8. W. Zhao, Z. Ghorannevis, L. Chu, M. Toh, C. Kloc, P. Tan, and G. Eda, ACS Nano 7, 791 (2013).
9. S. Das, M. Kim, J. Lee, and W. Choi, Crit. Rev. Solid State Mater. Sci. 39, 231 (2014).
10. M. Chhowalla, H. S. Shin, G. Eda, L.-J. Li, K. P. Loh, and H. Zhang, Nat. Chem. 5, 263 (2013).
11. H. Fang, S. Chuang, T. C. Chang, K. Takei, T. Takahashi, and A. Javey, Nano Lett. 12, 3788 (2012).
12. A. Beal, J. Knights, and W. Liang, J. Phys. Chem. C 5, 3540 (1972).
13. H. Fujiwara, Spectroscopic Ellipsometry: Principles and Applications (John Wiley and Sons, 2007).
14. I. Jung, M. Vaupel, M. Pelton, R. Piner, D. A. Dikin, S. Stankovich, J. An, and R. S. Ruoff, J. Phys. Chem. C 112, 8499 (2008).
15. V. G. Kravets, A. N. Grigorenko, R. R. Nair, P. Blake, S. Anissimova, K. S. Novoselov, and A. K. Geim, Phys. Rev. B 81, 155413 (2010).
16. E. R. Shaaban, M. S. Abd El-Sadek, M. El-Hagary, and I. S. Yahia, Phys. Scr. 86, 015702 (2012).
17. C. Yim, M. O’Brien, N. McEvoy, S. Winters, I. Mirza, J. G. Lunney, and G. S. Duesberg, Appl. Phys. Lett. 104, 103114 (2014).
18. I. H. Malitson, J. Opt. Soc. Am. 52, 1377 (1962).
19.See supplementary material at for presentation of Psemi fit tables and spectral data. [Supplementary Material]
20. C. Chiritescu, D. G. Cahill, N. Nguyen, D. Johnson, A. Bodapati, P. Keblinski, and P. Zschack, Science 315, 351 (2007).
21. S. Li, H. Miyazaki, H. Song, H. Kuramochi, and S. Nakaharai, ACS Nano 6, 7381 (2012).
22. R. A. Bromely and R. B. Murray, J. Phys. Chem. C 5, 738 (1972).
23. R. Coehoorn and C. Haas, Phys. Rev. B 35, 6203 (1987).
24. W. Zhao, R. M. Ribeiro, M. Toh, A. Carvalho, C. Kloc, A. H. Castro Neto, and G. Eda, Nano Lett. 13, 5627 (2013).

Data & Media loading...


Article metrics loading...



The utilization of tungsten diselenide (WSe) in electronic and optoelectronic devices depends on the ability to understand and control the process-property relationship during synthesis. We demonstrate that spectroscopic ellipsometry is an excellent technique for accurate, non-destructive determination of ultra-thin (<30 nm) WSe properties. The refractive index (n) and extinction coefficient (k) were found to be independent of thickness down to 1.3 nm, and were used to determine film thickness, which was confirmed to be within 9% of values found via atomic force microscopy. Finally, the optical bandgap was found to closely correlate with thickness, ranging from 1.2 to 1.55 eV as the WSe is thinned to the equivalent of 2 atomic layers.


Full text loading...


Access Key

  • FFree Content
  • OAOpen Access Content
  • SSubscribed Content
  • TFree Trial Content
752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd