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We report superconductivity at an onset critical temperature below 3.1 K in topological insulator ∼200-nm-thick BiTe thin films grown by pulsed laser deposition. Using energy-dispersive X-ray spectroscopy elemental mapping and Auger electron spectroscopy elemental depth profiling, we clearly identified bismuth (Bi) precipitation and Bi cluster signatures. Superconductivity in the BiTe films was attributed to the proximity effect of Bi clusters precipitated on the surface of the BiTe films.


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