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1.K. Chung, C.-H. Lee, and G.-C. Yi, Science 330, 655 (2010).
2.Y. J. Kim, J. H. Lee, and G.-C. Yi, Appl. Phys. Lett. 95, 213101 (2009).
3.J. M. Lee, Y. B. Pyun, J. Yi, J. W. Choung, and W. I. Park, J. Phys. Chem. C 113, 19134 (2009).
4.Z. L. Wang and J. H. Song, Science 312, 242 (2006).
5.H. Chang, Z. Sun, K. Y.-F. Ho, X. Tao, F. Yan, W.-M. Kwok, and Z. Zheng, Nanoscale 3, 258 (2011).
6.Z. Yin, S. Wu, X. Zhou, X. Huang, Q. Zhang, F. Boey, and H. Zhang, Small 6, 307 (2010).
7.W. I. Park, C.-H. Lee, J. M. Lee, N. J. Kim, and G.-C. Yi, Nanoscale 3, 3522 (2011).
8.R. K. Biroju, P. K. Giri, S. Dhara, K. Imakita, and M. Fujii, ACS Appl. Mater. Interfaces 6, 377 (2014).
9.B. Kumar, K. Y. Lee, H.-K. Park, S. J. Chae, Y. H. Lee, and S.-W. Kim, ACS Nano 5, 4197 (2011).
10.Y. T. Kim, J. H. Han, B. H. Hong, and Y. U. Kwon, Adv. Mater. 22, 515 (2010).
11.S. Sun, L. Gao, Y. Liu, and J. Sun, Appl. Phys. Lett. 98, 093112 (2011).
12.D. H. Wang, D. W. Choi, J. Li, Z. G. Yang, Z. M. Nie, R. Kou, D. H. Hu, C. M. Wang, L. V. Saraf, J. G. Zhang, I. A. Aksay, and J. Liu, ACS Nano 3, 907 (2009).
13.V. Sallet, J. F. Rommeluere, A. Lusson, A. Riviere, S. Fusil, O. Gorochov, and R. Triboulet, Phys. Status Solidi B 229, 903 (2002).<903::AID-PSSB903>3.0.CO;2-N
14.H. Yoo, K. Chung, Y. S. Choi, C. S. Kang, K. H. Oh, M. Kim, and G.-C. Yi, Adv. Mater. 24, 515 (2012).
15.X. W. Sun and H. S. Kwok, J. Appl. Phys. 86, 408 (1999).
16.S. K. Hong, H. J. Ko, Y. Chen, and T. Yao, J. Cryst. Growth 209, 537 (2000).
17.J. Narayan, K. Dovidenko, A. K. Sharma, and S. Oktyabrsky, J. Appl. Phys. 84, 2597 (1998).
18.K. Vanheusden, C. H. Seager, W. T. Warren, D. R. Tallant, and J. A. Voigt, Appl. Phys. Lett. 68, 403 (1996).
19.F. H. Leiter, H. R. Alves, A. Hofstaetter, D. M. Hofmann, and B. K. Meyer, Phys. Status Solidi B 226, R4 (2001).;2-F
20.H. Kato, M. Sano, K. Miyamoto, and T. Yao, Jpn. J. Appl. Phys., Part 1 42, 2241 (2003).
21.T. Gruber, C. Kirchner, and A. Waag, Phys. Status Solidi B 229, 841 (2002).<841::aid-pssb841>;2-a
22.S. T. Tan, X. W. Sun, Z. G. Yu, P. Wu, G. Q. Lo, and D. L. Kwong, Appl. Phys. Lett. 91, 072101 (2007).
23.D. C. Reynolds, D. C. Look, B. Jogai, C. W. Litton, T. C. Collins, W. Harsch, and G. Cantwell, Phys. Rev. B 57, 12151 (1998).
24.A. Teke, U. Ozgur, S. Dogan, X. Gu, H. Morkoc, B. Nemeth, J. Nause, and H. O. Everitt, Phys. Rev. B 70, 195207 (2004).
25.P. Zu, Z. K. Tang, G. K. L. Wong, M. Kawasaki, A. Ohtomo, H. Koinuma, and Y. Segawa, Solid State Commun. 103, 459 (1997).

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We report the growth of high-quality, smooth, and flat ZnO thin films on graphene layers and their photoluminescence (PL) characteristics. For the growth of high-quality ZnO thin films on graphene layers, ZnO nanowalls were grown using metal-organic vapor-phase epitaxy on oxygen-plasma treated graphene layers as an intermediate layer. PL measurements were conducted at low temperatures to examine strong near-band-edge emission peaks. The full-width-at-half-maximum value of the dominant PL emission peak was as narrow as 4 meV at T = 11 K, comparable to that of the best-quality films reported previously. Furthermore, the stimulated emission of ZnO thin films on the graphene layers was observed at the low excitation energy of 180 kW/cm2 at room temperature. Their structural and optical characteristics were investigated using X-ray diffraction, transmission electron microscopy, and PL spectroscopy.


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