Skip to main content

News about Scitation

In December 2016 Scitation will launch with a new design, enhanced navigation and a much improved user experience.

To ensure a smooth transition, from today, we are temporarily stopping new account registration and single article purchases. If you already have an account you can continue to use the site as normal.

For help or more information please visit our FAQs.

banner image
No data available.
Please log in to see this content.
You have no subscription access to this content.
No metrics data to plot.
The attempt to load metrics for this article has failed.
The attempt to plot a graph for these metrics has failed.
The full text of this article is not currently available.
/content/aip/journal/aplmater/3/11/10.1063/1.4935125
1.
1.S. De Wolf, A. Descoeudres, Z. C. Holman, and C. Ballif, Green 2, 7 (2012).
http://dx.doi.org/10.1515/green-2011-0018
2.
2.Z. C. Holman, M. Filipic, A. Descoeudres, S. De Wolf, F. Smole, M. Topic, and C. Ballif, J. Appl. Phys. 113, 013107 (2013).
http://dx.doi.org/10.1063/1.4772975
3.
3.T. Koida, H. Fujiwara, and M. Kondo, Sol. Energy Mater. Sol. Cells 93, 851 (2009).
http://dx.doi.org/10.1016/j.solmat.2008.09.047
4.
4.L. Barraud, Z. C. Holman, N. Badel, P. Reiss, A. Descoeudres, C. Battaglia, S. De Wolf, and C. Ballif, Sol. Energy Mater. Sol. Cells 115, 151 (2013).
http://dx.doi.org/10.1016/j.solmat.2013.03.024
5.
5.M. Morales-Masis, S. Martin de Nicolas, J. Holovsky, S. De Wolf, and C. Ballif, IEEE J. Photovoltaics 5, 1340 (2015).
http://dx.doi.org/10.1109/JPHOTOV.2015.2450993
6.
6.J. Werner, G. Dubuis, A. Walter, P. Löper, S.-J. Moon, S. Nicolay, M. Morales-Masis, S. De Wolf, B. Niesen, and C. Ballif, Sol. Energy Mater. Sol. Cells 141, 407 (2015).
http://dx.doi.org/10.1016/j.solmat.2015.06.024
7.
7.T. Tohsophon, J. Hüpkes, S. Calnan, W. Reetz, B. Rech, W. Beyer, and N. Sirikulrat, Thin Solid Films 511–512, 673 (2006).
http://dx.doi.org/10.1016/j.tsf.2005.12.130
8.
8.F. Matsumoto, M. Tani, and T. Enomoto, U.S. patent No. 5,105,291 (14 April 1992).
9.
9.D. E. Carlson, R. Romero, F. Willing, D. Meakin, L. Gonzalez, R. Murphy, H. R. Moutinho, and M. Al-Jassim, Prog. Photovoltaics 11, 377 (2003).
http://dx.doi.org/10.1002/pip.500
10.
10.D. Greiner, N. Papathanasiou, A. Pflug, F. Ruske, and R. Klenk, Thin Solid Films 520(4), 1285 (2011).
http://dx.doi.org/10.1016/j.tsf.2011.04.190
11.
11.J. S. Hong, B. R. Rhee, H. M. Kim, K. Ch. Je., Y. J. Kang, and J. S. Ahn, Thin Solid Films 467, 158 (2004).
http://dx.doi.org/10.1016/j.tsf.2004.03.014
12.
12.Y. Kishimoto, O. Nakagawara, H. Seto, Y. Koshido, and Y. Yoshino, Vacuum 83, 544 (2009).
http://dx.doi.org/10.1016/j.vacuum.2008.04.038
13.
13.C. Guillén and J. Herrero, Surf. Coat. Technol. 201, 309 (2006).
http://dx.doi.org/10.1016/j.surfcoat.2005.11.114
14.
14.A. Kaijou, M. Ohyama, M. Shibata, and K. Inoue, U.S. patent No. 5,972,527 (26 October 1999).
15.
15.J. I. Kim, W. Lee, T. Hwang, J. Kim, S.-Y. Lee, S. Kang, H. Choi, S. Hong, H. H. Park, T. Moon, and B. Park, Sol. Energy Mater. Sol. Cells 122, 282 (2014).
http://dx.doi.org/10.1016/j.solmat.2013.12.014
16.
16.J. Hüpkes, J. I. Owen, M. Wimmer, F. Ruske, D. Greiner, R. Klenk, U. Zastrow, and J. Hotovy, Thin Solid Films 555, 48 (2014).
http://dx.doi.org/10.1016/j.tsf.2013.08.011
17.
17.R. Sundaramoorthy, F. J. Pern, C. DeHart, T. Gennett, F. Y. Meng, M. Contreras, and T. Gessert, “Stability of TCO window layers for thin-film CIGS solar cells upon damp heat exposure: Part II,” Proc. SPIE 7412, 74120J (2009).
http://dx.doi.org/10.1117/12.826604
18.
18.M. Theelen, T. Boumans, F. Stegeman, F. Colberts, A. Illiberi, J. van Berkum, N. Barreau, Z. Vroon, and M. Zeman, Thin Solid Films 550, 530 (2014).
http://dx.doi.org/10.1016/j.tsf.2013.10.149
19.
19.S. Tabassum, E. Yamasue, H. Okumura, and K. N. Ishihara, J. Mater. Sci.: Mater. Electron. 25, 3203 (2014).
http://dx.doi.org/10.1007/s10854-014-2004-1
20.
20.T. Koida, H. Fujiwara, and M. Kondo, Jpn. J. Appl. Phys., Part 2 46, L685 (2007).
http://dx.doi.org/10.1143/JJAP.46.L685
21.
21.J. Steinhauser, S. Faÿ, N. Oliveira, E. Vallat-Sauvain, and C. Ballif, Appl. Phys. Lett. 90, 142107 (2007).
http://dx.doi.org/10.1063/1.2719158
22.
22.C. Donley, D. Dunphy, D. Paine, C. Carter, K. Nebesny, P. Lee, D. Alloway, and N. R. Armstrong, Langmuir 18, 450 (2002).
http://dx.doi.org/10.1021/la011101t
23.
23.See supplementary material at http://dx.doi.org/10.1063/1.4935125 for XRD spectra of the annealed IZO, ITO and IOH films and AFM surface scans of IO:H and ITO before and after damp heat treatment.[Supplementary Material]
24.
24.T. Koida, H. Shibata, M. Kondo, K. Tsutsumi, A. Sakaguchi, M. Suzuki, and H. Fujiwara, J. Appl. Phys. 111, 063721 (2012).
http://dx.doi.org/10.1063/1.3696978
25.
25.T. Koida, M. Kondo, K. Tsutsumi, A. Sakaguchi, M. Suzuki, and H. Fujiwara, J. Appl. Phys. 107, 033514 (2010).
http://dx.doi.org/10.1063/1.3284960
26.
26.B. Macco, H. C. M. Knoops, and W. M. M. Kessels, ACS Appl. Mater. Interfaces 7(30), 16723 (2015).
http://dx.doi.org/10.1021/acsami.5b04420
27.
27.H. F. Wardenga, M. V. Frischbier, M. Morales-Masis, and A. Klein, Materials 8, 561 (2015).
http://dx.doi.org/10.3390/ma8020561
28.
28.K. L. Purvis, G. Lu, J. Schwartz, and S. L. Bernasek, J. Am. Chem. Soc. 122, 1808 (2000).
http://dx.doi.org/10.1021/ja992910q
29.
29.A. Forget, B. Limoges, and V. Balland, Langmuir 31, 1931 (2015).
http://dx.doi.org/10.1021/la503760x
30.
30.J. S. Kim, P. K. H. Ho, D. S. Thomas, R. H. Friend, F. Cacialli, G.-W. Bao, and S. F. Y. Li, Chem. Phys. Lett. 315, 307 (1999).
http://dx.doi.org/10.1016/S0009-2614(99)01233-6
31.
31.Z. M. Jarzebski, Phys. Status Solidi A 71, 131982 (1982).
http://dx.doi.org/10.1002/pssa.2210710102
32.
32.M. Morales-Masis, L. Ding, F. Dauzou, Q. Jeangros, A. Hessler-Wyser, S. Nicolay, and C. Ballif, APL Mater. 2, 096113 (2014).
http://dx.doi.org/10.1063/1.4896051
33.
33.J. Steinhauser, S. Meyer, M. Schwab, S. Faÿ, C. Ballif, U. Kroll, and D. Borrello, Thin Solid Films 520, 558 (2011).
http://dx.doi.org/10.1016/j.tsf.2011.06.095
34.
34.T. L. Chen, R. Betancur, D. S. Ghosh, J. Martorell, and V. Pruneri, Appl. Phys. Lett. 100, 013310 (2012).
http://dx.doi.org/10.1063/1.3673843
35.
35.T. L. Chen, D. S. Ghosh, D. Krautz, S. Cheylan, and V. Pruneri, Appl. Phys. Lett. 99, 093302 (2011).
http://dx.doi.org/10.1063/1.3631674
http://aip.metastore.ingenta.com/content/aip/journal/aplmater/3/11/10.1063/1.4935125
Loading
/content/aip/journal/aplmater/3/11/10.1063/1.4935125
Loading

Data & Media loading...

Loading

Article metrics loading...

/content/aip/journal/aplmater/3/11/10.1063/1.4935125
2015-11-09
2016-12-06

Abstract

Large-scale deployment of a wide range of optoelectronic devices, including solar cells, critically depends on the long-term stability of their front electrodes. Here, we investigate the performance of Sn-doped InO (ITO), H-doped InO (IO:H), and Zn-doped InO (IZO) electrodes under damp heat (DH) conditions (85 °C, 85% relative humidity). ITO, IO:H capped with ITO, and IZO show high stability with only 3%, 9%, and 13% sheet resistance () degradation after 1000 h of DH, respectively. For uncapped IO:H, we find a 75% degradation, due to losses in electron Hall mobility (). We propose that this degradation results from chemisorbed OH- or HO-related species in the film, which is confirmed by thermal desorption spectroscopy and x-ray photoelectron spectroscopy. While strongly degrades during DH, the optical mobility () remains unchanged, indicating that the degradation mainly occurs at grain boundaries.

Loading

Full text loading...

/deliver/fulltext/aip/journal/aplmater/3/11/1.4935125.html;jsessionid=nvdgugC8GF2HX_RsoMFfCNp5.x-aip-live-06?itemId=/content/aip/journal/aplmater/3/11/10.1063/1.4935125&mimeType=html&fmt=ahah&containerItemId=content/aip/journal/aplmater
true
true

Access Key

  • FFree Content
  • OAOpen Access Content
  • SSubscribed Content
  • TFree Trial Content
752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
/content/realmedia?fmt=ahah&adPositionList=
&advertTargetUrl=//oascentral.aip.org/RealMedia/ads/&sitePageValue=APLMaterials.aip.org/3/11/10.1063/1.4935125&pageURL=http://scitation.aip.org/content/aip/journal/aplmater/3/11/10.1063/1.4935125'
Top,Right1,Right2,Right3,