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/content/aip/journal/aplmater/3/12/10.1063/1.4937432
1.
1.Y. J. Oh, J. H. Kim, C. V. Thompson, and C. A. Ross, Nanoscale 5, 401 (2013).
http://dx.doi.org/10.1039/C2NR32932H
2.
2.J. D. Fowlkes, L. Kondic, J. Diez, Y. Wu, and P. D. Rack, Nano Lett. 11, 2478 (2011).
http://dx.doi.org/10.1021/nl200921c
3.
3.J. Trice, C. Favazza, D. Thomas, H. Garcia, R. Kalyanaraman, and R. Sureshkumar, Phys. Rev. Lett. 101, 017802 (2008).
http://dx.doi.org/10.1103/PhysRevLett.101.017802
4.
4.Y. J. Oh, C. A. Ross, Y. S. Jung, Y. Wang, and C. V. Thompson, Small 5, 860 (2009).
http://dx.doi.org/10.1002/smll.200801433
5.
5.C. A. Ross, Annu. Rev. Mater. Res. 31, 203 (2001).
http://dx.doi.org/10.1146/annurev.matsci.31.1.203
6.
6.S. A. Maier, P. G. Kik, and H. A. Atwater, Phys. Rev. B 67, 205402 (2003).
http://dx.doi.org/10.1103/PhysRevB.67.205402
7.
7.A. Femius koenderink, Nano Lett. 9, 4228 (2009).
http://dx.doi.org/10.1021/nl902439n
8.
8.E. Moulin, J. Sukmanowski, P. Luo, R. Carius, F. X. Royer, and H. Stiebig, J. Non-Cryst. Solids 354, 2488 (2008).
http://dx.doi.org/10.1016/j.jnoncrysol.2007.09.031
9.
9.K. R. Catchpole and S. Pillai, J. Lumin. 121, 315 (2006).
http://dx.doi.org/10.1016/j.jlumin.2006.08.053
10.
10.Yu. A. Akimov, K. Ostrikov, and E. P. Li, Plasmonics 4, 107 (2009).
http://dx.doi.org/10.1007/s11468-009-9080-8
11.
11.T. L. Temple, G. D. K. Mahanama, H. S. Reehal, and D. M. Bagnall, Sol. Energy Mater. Sol. Cells 93, 1978 (2009).
http://dx.doi.org/10.1016/j.solmat.2009.07.014
12.
12.Y. F. Guan, R. C. Pearce, A. V. Melechko, D. K. Hensley, M. L. Simpson, and P. D. Rack, Nanotechnology 19, 235604 (2008).
http://dx.doi.org/10.1088/0957-4484/19/23/235604
13.
13.D. Kim, A. L. Giermann, and C. V. Thompson, Appl. Phys. Lett. 95, 251903 (2009).
http://dx.doi.org/10.1063/1.3268477
14.
14.R. Saxena, M. J. Frederick, G. Ramanath, W. N. Gill, and J. L. Plawsky, Phys. Rev. B 72, 115425 (2005).
http://dx.doi.org/10.1103/PhysRevB.72.115425
15.
15.D. J. Srolovitz and S. A. Safran, J. Appl. Phys. 60, 255 (1986).
http://dx.doi.org/10.1063/1.337691
16.
16.R. H. Brandon and F. J. Bradshaw, Technical Report, Royal Aircraft Establishment, Farnborough,1966.
17.
17.H. Wong, P. W. Voorhees, M. J. Miksis, and S. H. Davis, Acta Mater. 48, 1719 (2000).
http://dx.doi.org/10.1016/S1359-6454(00)00016-1
18.
18.P. Sutter, W. Ernst, Y. S. Choi, and E. Sutter, Appl. Phys. Lett. 88, 141924 (2006).
http://dx.doi.org/10.1063/1.2186741
19.
19.R. Nuryadi, Y. Ishikawa, and M. Tabe, Appl. Surf. Sci. 159-60, 121 (2000).
http://dx.doi.org/10.1016/S0169-4332(00)00051-9
20.
20.J. Ye and C. V. Thompson, Appl. Phys. Lett. 97, 071904 (2010).
http://dx.doi.org/10.1063/1.3480419
21.
21.J. Ye and C. V. Thompson, Acta Mater. 59, 582 (2011).
http://dx.doi.org/10.1016/j.actamat.2010.09.062
22.
22.C. M. Muller and R. Spolenak, Acta Mater. 58, 6035 (2010).
http://dx.doi.org/10.1016/j.actamat.2010.07.021
23.
23.H. J. Frost, C. V. Thompson, and D. T. Walton, Acta Metall. Mater. 38, 1455 (1990).
http://dx.doi.org/10.1016/0956-7151(90)90114-V
24.
24.C. V. Thompson, Annu. Rev. Mater. Res. 42(1), 9 (2012).
http://dx.doi.org/10.1146/annurev-matsci-070511-155048
25.
25.E. Jiran and C. V. Thompson, J. Electron. Mater. 19, 1153 (1990).
http://dx.doi.org/10.1007/BF02673327
26.
26.F. Y. Génin, W. W. Mullins, and P. Wynblatt, Acta Metall. Mater. 42, 1489 (1994).
http://dx.doi.org/10.1016/0956-7151(94)90167-8
27.
27.K. Thürmer, E. D. Willaims, and J. E. Reutt-Robey, Phys. Rev. B 68, 155423 (2003).
http://dx.doi.org/10.1103/PhysRevB.68.155423
28.
28.R. Abermann, Vacuum 41, 1278 (1990).
http://dx.doi.org/10.1016/0042-207X(90)93933-A
29.
29.R. P. Vinci, E. M. Zielinski, J. C. Bravman, and W. D. Nix, J. Appl. Phys. 88, 1389 (2000).
http://dx.doi.org/10.1063/1.373828
30.
30.D. J. Srolovitz and M. G. Goldiner, JOM 47, 31 (1990).
http://dx.doi.org/10.1007/BF03221433
31.
31.P. R. Gadkari, A. P. Warrant, R. M. Todi, R. V. Petrova, and K. R. Coffey, J. Vac. Sci. Technol., A 23, 1152 (2005).
http://dx.doi.org/10.1116/1.1861943
32.
32.See supplementary material at http://dx.doi.org/10.1063/1.4937432 for detailed information on the crystal planes that bound the void edges.[Supplementary Material]
33.
33.G. D. Barmparis and I. N. Remediakis, Phys. Rev. B 86, 085457 (2012).
http://dx.doi.org/10.1103/PhysRevB.86.085457
34.
34.Y. N. Wen and J. M. Zhang, Solid State Commun. 144, 163 (2007).
http://dx.doi.org/10.1016/j.ssc.2007.07.012
35.
35.R. V. Zucker, G. H. Kim, W. C. Carter, and C. V. Thompson, C. R. Phys. 14, 564 (2013).
http://dx.doi.org/10.1016/j.crhy.2013.06.005
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/content/aip/journal/aplmater/3/12/10.1063/1.4937432
2015-12-10
2016-09-30

Abstract

We analyzed the effect of crystallographic anisotropy on the morphological evolution of a 12-nm-thick goldfilm during solid-state dewetting at high temperatures using automated indexing tool in a transmission electron microscopy. Dewetting initiated at grain-boundary triple junctions adjacent to large grains resulting from abnormal grain growth driven by (111) texture development. Voids at the junctions developed shapes with faceted edges bounded by low-index crystal planes. The kinetic mobility of the edges varied with the crystal orientation normal to the edges, with a predominance of specific edges with the slowest retraction rates as the annealing time was increased.

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