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1.B. A. Bernevig, T. L. Hughes, and S. C. Zhang, Science 314, 1757 (2006).
2.L. Fu and C. L. Kane, Phys. Rev. B 76, 045302 (2007).
3.X. L. Qi and S. C. Zhang, Phys. Today 63(1), 33 (2010).
4.J. E. Moore, Nature 464, 194 (2010).
5.M. Z. Hasan and C. L. Kane, Rev. Mod. Phys. 82, 3045 (2010).
6.X. L. Qi, R. Li, J. Zang, and S. C. Zhang, Science 323, 1184 (2009).
7.W.-K. Tse and A. H. MacDonald, Phys. Rev. Lett. 105, 057401 (2010).
8.R. Yu, W. Zhang, H. J. Zhang, S. C. Zhang, X. Dai, and Z. Fang, Science 329, 61 (2010).
9.Y. S. Hor, P. Roushan, H. Beidenkopf, J. Seo, D. Qu, J. G. Checkelsky, L. A. Wray, D. Hsieh, Y. Xia, S. Y. Xu, D. Qian, M. Z. Hasan, N. P. Ong, A. Yazdani, and R. J. Cava, Phys. Rev. B 81, 195203 (2010).
10.J. S. Dyck, C. Drasar, P. Lost’ak, and C. Uher, Phys. Rev. B 71, 115214 (2005).
11.Z. Zhou, Y. J. Chien, and C. Uher, Phys. Rev. B 74, 224418 (2006).
12.J. S. Dyck, P. Hajek, P. Losit’ak, and C. Uher, Phys. Rev. B 65, 115212 (2002).
13.P. P. J. Haazen, J. B. Laloe, T. J. Nummy, H. J. M. Swagten, P. Jarillo-Herrero, D. Heiman, and J. S. Moodera, Appl. Phys. Lett. 100, 082404 (2012).
14.C. Z. Chang, J. S. Zhang, X. Feng, J. Shen, Z. C. Zhang, M. H. Guo, K. Li, Y. B. Ou, P. Wei, L. L. Wang, Z. Q. Ji, Y. Feng, S. H. Ji, X. Chen, J. F. Jia, X. Dai, Z. Fang, S. C. Zhang, K. He, Y. Y. Wang, L. Lu, X. C. Ma, and Q. K. Xue, Science 340, 167 (2013).
15.S. Oh, Science 340, 153 (2013).
16.J. G. Checkelsky, R. Yoshimi, A. Tsukazaki, K. S. Takahashi, Y. Kozuka, J. Falson, M. Kawasaki, and Y. Tokura, Nat. Phys. 10, 731 (2014).
17.X. Kou, S.-T. Guo, Y. Fan, L. Pan, M. Lang, Y. Jiang, Q. Shao, T. Nie, K. Murata, J. Tang, Y. Wang, L. He, T.-K. Lee, W.-L. Lee, and K. L. Wang, Phys. Rev. Lett. 113, 137201 (2014).
18.C. Z. Chang, W. Zhao, D. Kim, H. Zhang, B. Assaf, D. Heiman, S.-C. Zhang, C. Liu, M. Chan, and J. Moodera, Nat. Mater. 14, 473 (2015).
19.K. Lai, W. Kundhikanjana, M. A. Kelly, Z.-X. Shen, J. Shabani, and M. Shayegan, Phys. Rev. Lett. 107, 176809 (2011).
20.K. C. Nowack, E. M. Spanton, M. Baenninger, M. König, J. R. Kirtley, B. Kalisky, C. Ames, P. Leubner, C. Brüne, H. Buhmann, L. W. Molenkamp, D. Goldhaber-Gordon, and K. A. Moler, Nat. Mater. 12, 787 (2013).
21.E. M. Spanton, K. C. Nowack, L. Du, G. Sullivan, R.-R. Du, and K. A. Moler, Phys. Rev. Lett. 113, 026804 (2014).
22.C. Kittel, Rev. Mod. Phys. 21, 541 (1949).
23.Y. Geng, N. Lee, Y. J. Choi, S.-W. Cheong, and W. Wu, Nano Lett. 12, 6055 (2012).
24.D. Rugar, H. J. Mamin, P. Guethner, S. E. Lambert, J. E. Stern, I. McFadyen, and T. Yogi, J. Appl. Phys. 68, 1169 (1990).
25.See supplementary material at for step heights of cleaved surface, estimation of domain wall width, and complete MFM data sets.[Supplementary Material]
26.H. Li, Y. R. Song, M. Y. Yao, F. Yang, L. Mao, F. F. Zhu, C. H. Liu, C. L. Gao, D. Qian, X. Yao, J. F. Jia, Y. J. Shi, and D. Wu, Appl. Phys. Lett. 101, 072406 (2012).
27.F. Yang, Y. R. Song, H. Li, K. F. Zhang, X. Yao, C. Liu, D. Qian, C. L. Gao, and J.-F. Jia, Phys. Rev. Lett. 111, 176802 (2013).
28.J. J. Saenz, N. Garcia, P. Grutter, E. Meyer, H. Heinzelmann, R. Wiesendanger, L. Rosenthaler, H. R. Hidber, and H. J. Gunterodt, J. Appl. Phys. 62, 4293 (1987).
29.Y. Geng, J. H. Lee, D. G. Schlom, J. W. Freeland, and W. Wu, Phys. Rev. B 87, 121109 (2013).
30.S. Park, Y. Horibe, Y. J. Choi, C. L. Zhang, S. W. Cheong, and W. D. Wu, Phys. Rev. B 79, 180401 (2009).
31.A. Wadas and H. J. Hug, J. Appl. Phys. 72, 203 (1992).
32.L. Klein, J. S. Dodge, C. H. Ahn, G. J. Snyder, T. H. Geballe, M. R. Beasley, and A. Kapitulnik, Phys. Rev. Lett. 77, 2774 (1996).
33.F. Matsukura, H. Ohno, A. Shen, and Y. Sugawara, Phys. Rev. B 57, R2037 (1998).
34.E. Morosan, H. W. Zandbergen, L. Li, M. Lee, J. G. Checkelsky, M. Heinrich, T. Siegrist, N. P. Ong, and R. J. Cava, Phys. Rev. B 75, 104401 (2007).

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We report a systematic study of ferromagnetic domains in both single-crystal and thin-film specimens of magnetic topological insulators Cr doped (BiSb)Te using magnetic force microscopy(MFM). The temperature and field dependences of MFM and resistance data are consistent with previous bulk transport and magnetic characterization. Bubble-like ferromagnetic domains were observed in both single crystals and thin films. Significantly, smaller domain size (∼500 nm) with narrower domain wall (∼150 − 300 nm) was observed in thin films of magnetic topological insulators, likely due to vertical confinement effect. These results suggest that thin films are more promising for visualization of chiral edge states.


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