Skip to main content

News about Scitation

In December 2016 Scitation will launch with a new design, enhanced navigation and a much improved user experience.

To ensure a smooth transition, from today, we are temporarily stopping new account registration and single article purchases. If you already have an account you can continue to use the site as normal.

For help or more information please visit our FAQs.

banner image
No data available.
Please log in to see this content.
You have no subscription access to this content.
No metrics data to plot.
The attempt to load metrics for this article has failed.
The attempt to plot a graph for these metrics has failed.
The full text of this article is not currently available.
S. Yuasa, T. Nagahama, A. Fukushima, Y. Suzuki, and K. Ando, Nat. Mater. 3, 868 (2004).
S. S. P. Parkin, C. Kaiser, A. Panchula, P. M. Rice, B. Hughes, M. Samant, and S.-H. Yang, Nat. Mater. 3, 862 (2004).
C. Chappert, A. Fert, and F. N. Van Dau, Nat. Mater. 6, 813 (2007).
T. Valet and A. Fert, Phys. Rev. B 48, 7099 (1993).
J. Bass, J. Magn. Magn. Mater. 408, 244 (2016).
R. Wood, J. Magn. Magn. Mater. 321, 555 (2009).
M. Takagishi, K. Yamada, H. Iwasaki, H. N. Fuke, and S. Hashimoto, IEEE Trans. Magn. 46, 2086 (2010).
Y. Sakuraba, K. Izumi, T. Iwase, S. Bosu, K. Saito, K. Takanashi, Y. Miura, K. Futatsukawa, K. Abe, and M. Shirai, Phys. Rev. B 82, 094444 (2010).
Y. K. Takahashi, N. Hase, M. Kodzuka, A. Itoh, T. Koganezawa, T. Furubayashi, S. Li, B. C. S. Varaprasad, T. Ohkubo, and K. Hono, J. Appl. Phys. 113, 223901 (2013).
J. Sato, M. Oogane, H. Naganuma, and Y. Ando, Appl. Phys. Express 4, 113005 (2011).
Y. K. Takahashi, A. Srinivasan, B. Varaprasad, A. Rajanikanth, N. Hase, T. M. Nakatani, S. Kasai, T. Furubayashi, and K. Hono, Appl. Phys. Lett. 98, 152501 (2011).
M. J. Carey, S. Maat, S. Chandrashekariaih, J. A. Katine, W. Chen, B. York, and J. R. Childress, J. Appl. Phys. 109, 093912 (2011).
Y. Du, B. S. D. C. S. Varaprasad, Y. K. Takahashi, T. Furubayashi, and K. Hono, Appl. Phys. Lett. 103, 202401 (2013).
T. M. Nakatani, Y. Du, Y. K. Takahashi, T. Furubayashi, and K. Hono, Acta Mater. 61, 3695 (2013).
H. Takagi, K. Kikuchi, R. Maeda, T. R. Chung, and T. Suga, Appl. Phys. Lett. 68, 2222 (1996).
W. Yang, D. N. Lambeth, L. Tang, and D. E. Laughlin, J. Appl. Phys. 81, 4370 (1997).
D. K. Fork, F. A. Ponce, J. C. Tramontana, and T. H. Geballe, Appl. Phys. Lett. 58, 2294 (1991).
P. Tiwari, X. D. Wu, S. R. Foltyn, Q. X. Jia, I. H. Campbell, P. A. Arendt, R. E. Muenchausen, D. E. Peterson, T. E. Mitchell, and J. Narayan, Appl. Phys. Lett. 65, 2693 (1994).
Y. Dutchak and V. Chekh, J. Phys. Chem. 55, 1326 (1981).
J. Chen, T. Furubayashi, Y. K. Takahashi, T. T. Sasaki, and K. Hono, J. Appl. Phys. 117, 17C119 (2015).
J. Chen, S. Li, T. Furubayashi, Y. K. Takahashi, and K. Hono, J. Appl. Phys. 115, 233905 (2014).
J. E. Mahan, K. M. Geib, G. Y. Robinson, R. G. Long, Y. Xinghua, G. Bai, M.-A. Nicolet, and M. Nathan, Appl. Phys. Lett. 56, 2126 (1990).
S. Olive Mendez, V. Le Thanh, A. Ranguis, and J. Derrien, Appl. Surf. Sci. 254, 6040 (2008).
S. Li, Y. K. Takahashi, T. Furubayashi, and K. Hono, Appl. Phys. Lett. 103, 042405 (2013).
T. Nakatani, G. Mihajlović, J. C. Read, Y. Choi, and J. R. Childress, Appl. Phys. Express 8, 093003 (2015).

Data & Media loading...


Article metrics loading...



In this letter, we report a NiAl buffer layer as a template for the integration of epitaxial current-perpendicular-plane-giant magnetoresistive (CPP-GMR) devices on a Si(001) single crystalline substrate. By depositing NiAl on a Si wafer at an elevated temperature of 500 °C, a smooth and epitaxial 2-type NiAl(001) layer was obtained. The surface roughness was further improved by depositing Ag on the NiAl layer and applying subsequent annealing process. The epitaxial CPP-GMR devices grown on the buffered Si(001) substrate present a large magnetoresistive output comparable with that of the devices grown on an MgO(001) substrate, demonstrating the possibility of epitaxial spintronic devices with a NiAl templated Si wafer for practical applications.


Full text loading...


Access Key

  • FFree Content
  • OAOpen Access Content
  • SSubscribed Content
  • TFree Trial Content
752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd