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We present a detailed study of compressively strained PbSrTiO thin films grown by off-axis radio frequency magnetron sputtering on (001)-oriented Nb-doped SrTiO substrates. Film tetragonality and the ferroelectric critical temperatures are measured for samples of different composition and thickness and compared with a phenomenological Landau-Devonshire model. 180 ferroelectric domains are observed using both X-ray diffraction and piezoresponse force microscopy and domain sizes obtained by the two techniques are compared and discussed.


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