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Ferroelectric domains in epitaxial Pbx
thin films investigated using X-ray diffraction and piezoresponse force microscopy
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We present a detailed study of compressively strained PbxSr1−xTiO3
thin films grown by off-axis radio frequency magnetron sputtering on (001)-oriented Nb-doped SrTiO3 substrates. Film tetragonality and the ferroelectric critical temperatures are measured for samples of different composition and thickness and compared with a phenomenological Landau-Devonshire model. 180∘
ferroelectric domains are observed using both X-ray diffraction and piezoresponse force microscopy and domain sizes obtained by the two techniques are compared and discussed.
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