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Electronic detection of surface plasmon polaritons by metal-oxide-silicon capacitor
F. Khalilzadeh-Rezaie, R. E. Peale, D. Panjwani, C. W. Smith, J. Nath, M. Lodge, M. Ishigami, N. Nader, S. Vangala, M. Yannuzzi, and J. W. Cleary, Proc. SPIE 9617, 96170E (2015).
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J. W. Cleary, W. H. Streyer, N. Nader, S. Vangala, I. Avrutsky, B. Claflin, J. Hendrickson, D. Wasserman, R. E. Peale, and W. R. Buchwald, Opt. Express 23, 3316 (2015).
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An electronic detector of surface plasmon polaritons (SPPs) is reported. SPPs optically excited on a metal surface using a prism coupler are detected by using a close-coupled metal-oxide-silicon (MOS)
capacitor. Incidence-angle dependence is explained by Fresnel transmittance calculations, which also are used to investigate the dependence of photo-response on structure dimensions. Electrodynamic simulations agree with theory and experiment and additionally provide spatial intensity distributions on and off the SPP excitation resonance. Experimental dependence of the photoresponse on substrate carrier type, carrier concentration, and back-contact biasing is qualitatively explained by simple theory of MOS capacitors.
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