Skip to main content

News about Scitation

In December 2016 Scitation will launch with a new design, enhanced navigation and a much improved user experience.

To ensure a smooth transition, from today, we are temporarily stopping new account registration and single article purchases. If you already have an account you can continue to use the site as normal.

For help or more information please visit our FAQs.

banner image
No data available.
Please log in to see this content.
You have no subscription access to this content.
No metrics data to plot.
The attempt to load metrics for this article has failed.
The attempt to plot a graph for these metrics has failed.
The full text of this article is not currently available.
/content/aip/journal/app/1/6/10.1063/1.4962428
1.
P. Berini, Laser Photonics Rev. 8, 197 (2014).
http://dx.doi.org/10.1002/lpor.201300019
2.
A. Otto, Z. Phys. 216, 398 (1968).
http://dx.doi.org/10.1007/BF01391532
3.
C. Daboo, M. J. Baird, H. P. Hughes, N. Apsley, and M. T. Emeny, Thin Solid Films 201, 9 (1991).
http://dx.doi.org/10.1016/0040-6090(91)90150-V
4.
E. Kretschmann, Z. Phys. 241, 313 (1971).
http://dx.doi.org/10.1007/BF01395428
5.
C. W. Smith, D. Maukonen, R. E. Peale, C. J. Fredricksen, M. Ishigami, and J. W. Cleary, Proc. SPIE 9083, 90832Q (2014).
http://dx.doi.org/10.1117/12.2050018
6.
F. Khalilzadeh-Rezaie, R. E. Peale, D. Panjwani, C. W. Smith, J. Nath, M. Lodge, M. Ishigami, N. Nader, S. Vangala, M. Yannuzzi, and J. W. Cleary, Proc. SPIE 9617, 96170E (2015).
http://dx.doi.org/10.1117/12.2188706
7.
J. W. Cleary, G. Medhi, R. E. Peale, and W. R. Buchwald, Appl. Opt. 49, 3102 (2010).
http://dx.doi.org/10.1364/AO.49.003102
8.
J. W. Cleary, R. E. Peale, D. J. Shelton, G. D. Boreman, C. W. Smith, M. Ishigami, R. Soref, A. Drehman, and W. R. Buchwald, J. Opt. Soc. Am. B 27, 730 (2010).
http://dx.doi.org/10.1364/JOSAB.27.000730
9.
J. W. Cleary, G. Medhi, M. Shahzad, I. Rezadad, D. Maukonen, R. E. Peale, G. D. Boreman, S. Wentzell, and W. R. Buchwald, Opt. Express 20, 2693 (2012).
http://dx.doi.org/10.1364/OE.20.002693
10.
M. Shahzad, G. Medhi, R. E. Peale, W. R. Buchwald, J. W. Cleary, R. Soref, G. D. Boreman, and O. Edwards, J. Appl. Phys. 11, 123105 (2011).
http://dx.doi.org/10.1063/1.3672738
11.
F. Khalilzadeh-Rezaie, C. W. Smith, J. Nath, N. Nader, M. Shahzad, J. W. Cleary, I. Avrutsky, and R. E. Peale, J. Nanophotonics 9, 093792 (2015).
http://dx.doi.org/10.1117/1.jnp.9.093792
12.
J. W. Cleary, W. H. Streyer, N. Nader, S. Vangala, I. Avrutsky, B. Claflin, J. Hendrickson, D. Wasserman, R. E. Peale, and W. R. Buchwald, Opt. Express 23, 3316 (2015).
http://dx.doi.org/10.1364/OE.23.003316
13.
F. Khalilzadeh-Rezaie, I. O. Oladeji, J. W. Cleary, N. Nader, J. Nath, I. Rezadad, and R. E. Peale, Opt. Mat. Express 5, 2184 (2015).
http://dx.doi.org/10.1364/ome.5.002184
14.
L. D. Landau, E. M. Lifshitz, and L. P. Pitaevskii, Electrodynamics of Continuous Media, 2nd ed. (Butterworth-Heinemann, Oxford, 1984), Section 86.
15.
Handbook of Optical Constants of Solids, edited by E. D. Palik (Academic Press, San Diego, 1985), p. 294, 356, 565, and 760.
16.
17.
J. Nath, E. Smith, D. Maukonen, and R. E. Peale, J. Appl. Phys. 115, 193103 (2014).
http://dx.doi.org/10.1063/1.4876117
18.
R. F. Pierret, Semiconductor Device Fundamentals (Addison-Wesley, Reading, 1996), pp. 563600.
http://aip.metastore.ingenta.com/content/aip/journal/app/1/6/10.1063/1.4962428
Loading
/content/aip/journal/app/1/6/10.1063/1.4962428
Loading

Data & Media loading...

Abstract

An electronic detector of surface plasmon polaritons (SPPs) is reported. SPPs optically excited on a metal surface using a prism coupler are detected by using a close-coupled metal-oxide-silicon (MOS) capacitor. Incidence-angle dependence is explained by Fresnel transmittance calculations, which also are used to investigate the dependence of photo-response on structure dimensions. Electrodynamic simulations agree with theory and experiment and additionally provide spatial intensity distributions on and off the SPP excitation resonance. Experimental dependence of the photoresponse on substrate carrier type, carrier concentration, and back-contact biasing is qualitatively explained by simple theory of MOS capacitors.

Loading

Full text loading...

/deliver/fulltext/aip/journal/app/1/6/1.4962428.html;jsessionid=wYBDlJ7P6JxvPQ6mipqiXFtV.x-aip-live-03?itemId=/content/aip/journal/app/1/6/10.1063/1.4962428&mimeType=html&fmt=ahah&containerItemId=content/aip/journal/app
true
true

Access Key

  • FFree Content
  • OAOpen Access Content
  • SSubscribed Content
  • TFree Trial Content
752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
/content/realmedia?fmt=ahah&adPositionList=
&advertTargetUrl=//oascentral.aip.org/RealMedia/ads/&sitePageValue=app.aip.org/1/6/10.1063/1.4962428&pageURL=http://scitation.aip.org/content/aip/journal/app/1/6/10.1063/1.4962428'
Right1,Right2,Right3,