X-ray diffractograms (XRDs) of the undoped (a) and Er-doped ZnO films for (b) and (c) Er concentrations.
Relative integrated intensity of the (100) and (101) x-ray peaks measured from the intensity of the (002) peak with respect to Er content in the investigated samples.
SEM images of Er-doped ZnO films collected under the incident electron beam energy : (a) for , (b) for , and (c) for Er concentrations. The inset of image (a) depicts the undoped ZnO film’s micrograph at the same scale, as proposed in Ref. 8.
Dependence of the mean grain size extracted from the SEM images on the sample Er concentration.
Dependence of the CL-spectral characteristics of the undoped- and Er-doped ZnO films on the sample’s Er concentration obtained at the incident electron beam energy .
Dependence of the CL spectral characteristics of -doped ZnO sample on the incident electron beam energies: (a) for , (b) for , (c) for , (d) for , (e) for , and (f) for .
Gaussian decomposition of CL spectra related to the -doped ZnO sample for two different incident electron beam energies: (a) for and (b) for .
Normalization (from the UV band) of the integrated intensity related to the main emission peaks and its dependence on the sample Er concentration for .
Normalization (from the UV band) of the integrated intensity related to the green emission peak and its dependence on the incident electron beam energy for three different samples Er concentration.
Monochromatic CL images of the -doped ZnO films collected at , with a focalized spot of diameter: (a) for , (b) for , and (c) for wavelengths.
Compositional feature of the investigated Er doped ZnO films deposited a constant flow rate value .
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