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Photoreflectance determination of the wetting layer thickness in the quantum dot system for a broad indium content range of 0.3–1
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10.1063/1.2364604
/content/aip/journal/jap/100/10/10.1063/1.2364604
http://aip.metastore.ingenta.com/content/aip/journal/jap/100/10/10.1063/1.2364604
/content/aip/journal/jap/100/10/10.1063/1.2364604
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/content/aip/journal/jap/100/10/10.1063/1.2364604
2006-11-29
2014-10-23
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Photoreflectance determination of the wetting layer thickness in the InxGa1−xAs∕GaAs quantum dot system for a broad indium content range of 0.3–1
http://aip.metastore.ingenta.com/content/aip/journal/jap/100/10/10.1063/1.2364604
10.1063/1.2364604
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