Temperature dependence of the electrical resistivity for with and . The solid and dashed lines correspond to cooling and heating measurement, respectively.
The temperature dependence of the lattice parameters for (left graphs) and (right graphs).The primary (PM or FM) phase (closed symbols) and the secondary (AF) phase (open symbols) are shown as a function of temperature ranging from 4.2 to 240 K in a designated magnetic field.
Lattice distortion, , as a function of temperature measured without magnetic field for sample (close circles for the PM and/or FM phase, and close squares for the AF phase) and sample (open circles for the PM and/or FM phase, and open squares for the AF phase).
Diffraction patterns of peaks (220) and (004) as a function of temperature, measured with increasing temperature without magnetic field for (a) sample and (c) sample ; and for (b) sample and (d) sample after the MF training (field-cooled down in to 4.2 K and then the magnetic field removed).
Temperature dependence of the FWHM of the peaks (220) and (004) of the primary phases for (upper panel) and (lower panel) with (filled symbols) and without (open symbols) the MF training.
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