(a) S-shaped beams are attached over a long length . (b) Arc-shaped beams are attached only very near their tips, see Ref. 6.
Typical total energy curve, see Ref. 4.
(Color online) Au microswitch cross section.
(Color online) Au microswitch top view.
(Color online) AFM images of surfaces in contact: (a) Au substrate surface topology and (b) Au beam bottom surface topology.
SEM images of surfaces in contact: (a) Au substrate surface and (b) Au beam bottom surface.
SEM measurements of detachment length: (a) totally released beam and one arc-shaped beam, (b) S-shaped beam, and (c) most adhered in S-shaped beams.
Au-coated AFM tip with tip radius of .
(Color online) Cross-sectional topology of the beam bottom surface.
(Color online) FEM simulated AFM probe cantilever deflection due to self-weight.
(Color online) FEM simulated beam deflection due to displacement constraint. (, etc.)
(Color online) Young’s modulus measurements for Au beams.
(Color online) Detachment length measurements for S-shaped beams.
(Color online) Adhesion energy obtained from S-shaped beams.
(Color online) Typical force-displacement curve obtained from AFM adhesion experiment.
(Color online) Finite element method is used to determine the crack mode mixity (, etc.).
The models used to simulate effects of crack shielding, see Ref. 25. (a) Single role model and (b) zone model.
(Color online) Variation of shielding vs attachment length, , for single row and zone models.
Adhesion energy measurements from S-shaped beams.
Adhesion energy measurements from arc-shaped beams.
Nondimensional transition parameter calculation.
Adhesion energy corrected for crack shielding effects.
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