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XPS depth profile graph of the constituent elements of PZT–CFO thin films, the drawn vertical lines indicate the tentative position of PZT/CFO interface (B and D), CFO/PZT (C and E), the substrate and PZT interface (A), and PZT and air interfaces (F).
Frequency dispersion of (a) the dielectric constant and (b) loss tangent of PZT–CFO thin films.
Ferromagnetic hysteresis loops of CFO and PZT–CFO thin films measured at room temperature.
Polarization hysteresis of PZT–CFO thin films measured applying magnetic field in the range of .
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