Schematic diagram of the bubbler.
XPS survey spectrum of the sample grown with . Insets: main core levels and XPS spectra with their deconvoluted features.
Plot of absolute boron concentration as a function of the corresponding molarities of in .
Raman spectra of samples doped with different molarities of .
A typical Raman spectrum fitted with a pair of Gaussian and Lorentzian line shapes. Inset: depth profile of the estimated boron concentration along the film thickness.
Microphotoluminescence spectra of samples doped with different molarities of .
XRD pattern of a typical sample doped with . Inset: plot of mean lattice constant as a function of absolute boron concentration in the samples.
SEM micrograph of samples doped with and .
Variation of sheet resistance and carrier concentration of samples as a function of ratio.
Plot of logarithm of conductivity vs temperature for (a) lightly doped and (b) heavily doped diamond thin film samples.
Deposition parameters used for sample preparation.
B:C ratio for samples grown with different molarities of .
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