Comparisons between the measured and simulated XRD patterns of (a) and (b) samples.
Frequency dependence of relative dielectric constant and loss tangent for and samples.
Polarization hysteresis loops of samples measured at for three maximum electric fields of 108, 150, and .
Magnetization hysteresis loops of and samples for the maximum magnetic field of .
(a) Temperature dependence of relative dielectric constant and loss tangent at for samples and (b) heat flow vs temperature curve for the samples.
The refined structural parameters of and samples based on the measured XRD patterns shown in Fig. 1 and according to a triclinic structure with space group.
Article metrics loading...
Full text loading...