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Transmission electron microscopy assessment of the Si enhancement of Ohmic contacts to undoped heterostructures
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10.1063/1.2218262
/content/aip/journal/jap/100/3/10.1063/1.2218262
http://aip.metastore.ingenta.com/content/aip/journal/jap/100/3/10.1063/1.2218262
/content/aip/journal/jap/100/3/10.1063/1.2218262
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/content/aip/journal/jap/100/3/10.1063/1.2218262
2006-08-02
2014-09-30
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Transmission electron microscopy assessment of the Si enhancement of Ti∕Al∕Ni∕Au Ohmic contacts to undoped AlGaN∕GaN heterostructures
http://aip.metastore.ingenta.com/content/aip/journal/jap/100/3/10.1063/1.2218262
10.1063/1.2218262
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