1887
banner image
No data available.
Please log in to see this content.
You have no subscription access to this content.
No metrics data to plot.
The attempt to load metrics for this article has failed.
The attempt to plot a graph for these metrics has failed.
Electronic resonant images of an ion implanted Si(111) substrate observed by wavelength tunable optical second harmonic microscopy
Rent:
Rent this article for
USD
10.1063/1.2266158
/content/aip/journal/jap/100/4/10.1063/1.2266158
http://aip.metastore.ingenta.com/content/aip/journal/jap/100/4/10.1063/1.2266158
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

Experimental setup for the second harmonic (SH) microscopy.

Image of FIG. 2.
FIG. 2.

Raman spectra of the Si phonon band of (a) nondoped and [(b) and (c)] As-doped areas. The areas , , and are defined in Fig. 3(i). The shadowed parts in the spectra of (b) and (c) represent the contribution of amorphous structure.

Image of FIG. 3.
FIG. 3.

SH intensity images of an As-doped Si substrate at the SH photon energy from . The white dots represents the observed SH photons. The doped pattern is illustrated in (i).

Image of FIG. 4.
FIG. 4.

Linear optical reflection images of an As-doped Si substrate at the incident photon energy from . The reflectivity is high where the image is bright.

Image of FIG. 5.
FIG. 5.

SH intensity as a function of the SH photon energy for nondoped area (circle) and As-doped areas (triangle) and (cross). The areas , , and are defined in Fig. 3(i). The SH intensity of the As-doped area (triangle) is magnified to 20 times the original intensity. Dashed line and gray and black solid lines are guides to the eyes.

Image of FIG. 6.
FIG. 6.

Linear optical reflectivity as a function of the wavelength for nondoped area (dashed line), As-doped areas (gray solid line), and (black solid line). The areas , , and are defined in Fig. 3(i).

Loading

Article metrics loading...

/content/aip/journal/jap/100/4/10.1063/1.2266158
2006-08-23
2014-04-19
Loading

Full text loading...

This is a required field
Please enter a valid email address
752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Electronic resonant images of an ion implanted Si(111) substrate observed by wavelength tunable optical second harmonic microscopy
http://aip.metastore.ingenta.com/content/aip/journal/jap/100/4/10.1063/1.2266158
10.1063/1.2266158
SEARCH_EXPAND_ITEM