1887
banner image
No data available.
Please log in to see this content.
You have no subscription access to this content.
No metrics data to plot.
The attempt to load metrics for this article has failed.
The attempt to plot a graph for these metrics has failed.
Depth profiling of strain and defects in heterostructures by micro-Raman imaging
Rent:
Rent this article for
USD
10.1063/1.2355431
/content/aip/journal/jap/100/7/10.1063/1.2355431
http://aip.metastore.ingenta.com/content/aip/journal/jap/100/7/10.1063/1.2355431
/content/aip/journal/jap/100/7/10.1063/1.2355431
Loading

Data & Media loading...

Loading

Article metrics loading...

/content/aip/journal/jap/100/7/10.1063/1.2355431
2006-10-09
2014-09-02
Loading

Full text loading...

This is a required field
Please enter a valid email address
This feature is disabled while Scitation upgrades its access control system.
This feature is disabled while Scitation upgrades its access control system.
752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Depth profiling of strain and defects in Si∕Si1−xGex∕Si heterostructures by micro-Raman imaging
http://aip.metastore.ingenta.com/content/aip/journal/jap/100/7/10.1063/1.2355431
10.1063/1.2355431
SEARCH_EXPAND_ITEM