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Parameter determination from resistance-voltage curve for long-wavelength HgCdTe photodiode
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10.1063/1.2358411
/content/aip/journal/jap/100/8/10.1063/1.2358411
http://aip.metastore.ingenta.com/content/aip/journal/jap/100/8/10.1063/1.2358411

Figures

Image of FIG. 1.
FIG. 1.

Fitting results of the artificial curves with the generated noise levels of 1% (a), 2% (b), and 3% (c).

Image of FIG. 2.
FIG. 2.

Normalized sensitivity criterion vs the bias for the six fitting parameters.

Image of FIG. 3.
FIG. 3.

Measured curves of three real devices and their fitting results for samples A (a), B (b), and C (c).

Tables

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Table I.

Material and device parameters, which are not used as fitting parameters, for calculating the curves in Fig. 1.

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Table II.

Comparisons of the assigned values of the six fitting parameters and the fitting results of the theoretically generated curves whose noise levels are 1%, 2%, and 3%, respectively. (Data in brackets are the standard errors of the results from ten fits in different fitting paths.)

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Table III.

Error ranges of the six fitting parameters of the theoretical curves whose noise levels are 1%, 2%, and 3%, respectively. (Data in brackets are the real errors.)

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Table IV.

Material and device parameters, which are not used as fitting parameters, for the curves of the real devices A, B, and C.

Generic image for table
Table V.

Six fitting parameters of , , , , , and and their error ranges extracted from the measured curves of the real devices A, B, and C. (Data in brackets are the error ranges).

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/content/aip/journal/jap/100/8/10.1063/1.2358411
2006-10-18
2014-04-17
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Parameter determination from resistance-voltage curve for long-wavelength HgCdTe photodiode
http://aip.metastore.ingenta.com/content/aip/journal/jap/100/8/10.1063/1.2358411
10.1063/1.2358411
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