Definition of various angles required to describe the diffraction geometries and variations in the angle in the scan mode. is the inclination angle of the sample surface normal ( axis) with respect to the diffraction vector ( axis). and denote the rotation of the sample around the sample surface and its normal axis, respectively.
Thermal expansion of and silicon (Ref. 23).
(a) (111), (200), (002), and (b) (001) diffraction peaks of the thin film for different annealing times (0, 3, 10, 15, 20, 30, and ).
Proposed strain vs plot when in-plane and ordering strains coexist.
Strain vs plots of the film annealed at (a) for , (b) for , (c) for , and (d) for .
Strain energy differences between (001) and (100) crystals as a function of annealing time.
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