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The effect of residual strain on (001) texture evolution in FePt thin film during postannealing
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10.1063/1.2364051
/content/aip/journal/jap/100/9/10.1063/1.2364051
http://aip.metastore.ingenta.com/content/aip/journal/jap/100/9/10.1063/1.2364051
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

Definition of various angles required to describe the diffraction geometries and variations in the angle in the scan mode. is the inclination angle of the sample surface normal ( axis) with respect to the diffraction vector ( axis). and denote the rotation of the sample around the sample surface and its normal axis, respectively.

Image of FIG. 2.
FIG. 2.

Thermal expansion of and silicon (Ref. 23).

Image of FIG. 3.
FIG. 3.

(a) (111), (200), (002), and (b) (001) diffraction peaks of the thin film for different annealing times (0, 3, 10, 15, 20, 30, and ).

Image of FIG. 4.
FIG. 4.

Proposed strain vs plot when in-plane and ordering strains coexist.

Image of FIG. 5.
FIG. 5.

Strain vs plots of the film annealed at (a) for , (b) for , (c) for , and (d) for .

Image of FIG. 6.
FIG. 6.

Strain energy differences between (001) and (100) crystals as a function of annealing time.

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/content/aip/journal/jap/100/9/10.1063/1.2364051
2006-11-13
2014-04-25
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: The effect of residual strain on (001) texture evolution in FePt thin film during postannealing
http://aip.metastore.ingenta.com/content/aip/journal/jap/100/9/10.1063/1.2364051
10.1063/1.2364051
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