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Accuracy limits and window corrections for photon Doppler velocimetry
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10.1063/1.2407290
/content/aip/journal/jap/101/1/10.1063/1.2407290
http://aip.metastore.ingenta.com/content/aip/journal/jap/101/1/10.1063/1.2407290

Figures

Image of FIG. 1.
FIG. 1.

Experimental configuration for projectile velocity measurements using PDV probes and shorting pins.

Image of FIG. 2.
FIG. 2.

Experimental configuration for PDV/VISAR symmetric impact experiments.

Image of FIG. 3.
FIG. 3.

(Color) PDV power spectrum for shot No. 56–06–17 (colorbar represents units of decibels). Data show projectile velocity (approximately constant) for of recording time. Raw PDV data are plotted as voltage vs time (inset).

Image of FIG. 4.
FIG. 4.

Apparent velocity records for -cut sapphire obtained using the VISAR (532 nm). Four records are shown with peak stresses of 58.9 (No. 56–06–21), 103.6 (No. 56–06–22), 139.7 (No. 56–06–23), and 174.0 kbar (No. 56–06–24). The record for shot 56–06–24 ended abruptly due to light loss in the VISAR.

Image of FIG. 5.
FIG. 5.

(Color) PDV data obtained for -cut sapphire data for shot No. 56–06–23.

Image of FIG. 6.
FIG. 6.

(Color) Comparison between PDV data (image) and VISAR data (black curve) for free surface measurement on ultrapure LiF(100).

Image of FIG. 7.
FIG. 7.

Plots of refractive index vs density for all three materials. Solid circles indicate data taken using 532 nm laser light. Solid triangles indicate data taken with 1550 nm laser light. Solid and dashed lines represent the numerical fits to the data for 532 and 1550 nm, respectively.

Image of FIG. 8.
FIG. 8.

Conceptual diagram of a PDV measurement.

Image of FIG. 9.
FIG. 9.

Multiple window reflections.

Image of FIG. 10.
FIG. 10.

Conceptual PDV power spectrum for a symmetric sapphire impact. Horizontal lines indicate the position of spectral peaks.

Tables

Generic image for table
Table I.

Comparison of shorting pin and PDV impact velocity measurements.

Generic image for table
Table II.

Relevant experimental parameters and measured quantities. (L)iF, (S)apphire, and (Q)uartz indicates the material used in each experiment.

Generic image for table
Table III.

Window corrections for LiF(100), -cut sapphire, and -cut quartz.

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/content/aip/journal/jap/101/1/10.1063/1.2407290
2007-01-12
2014-04-24
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Accuracy limits and window corrections for photon Doppler velocimetry
http://aip.metastore.ingenta.com/content/aip/journal/jap/101/1/10.1063/1.2407290
10.1063/1.2407290
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