Experimental configuration for projectile velocity measurements using PDV probes and shorting pins.
Experimental configuration for PDV/VISAR symmetric impact experiments.
(Color) PDV power spectrum for shot No. 56–06–17 (colorbar represents units of decibels). Data show projectile velocity (approximately constant) for of recording time. Raw PDV data are plotted as voltage vs time (inset).
Apparent velocity records for -cut sapphire obtained using the VISAR (532 nm). Four records are shown with peak stresses of 58.9 (No. 56–06–21), 103.6 (No. 56–06–22), 139.7 (No. 56–06–23), and 174.0 kbar (No. 56–06–24). The record for shot 56–06–24 ended abruptly due to light loss in the VISAR.
(Color) PDV data obtained for -cut sapphire data for shot No. 56–06–23.
(Color) Comparison between PDV data (image) and VISAR data (black curve) for free surface measurement on ultrapure LiF(100).
Plots of refractive index vs density for all three materials. Solid circles indicate data taken using 532 nm laser light. Solid triangles indicate data taken with 1550 nm laser light. Solid and dashed lines represent the numerical fits to the data for 532 and 1550 nm, respectively.
Conceptual diagram of a PDV measurement.
Multiple window reflections.
Conceptual PDV power spectrum for a symmetric sapphire impact. Horizontal lines indicate the position of spectral peaks.
Comparison of shorting pin and PDV impact velocity measurements.
Relevant experimental parameters and measured quantities. (L)iF, (S)apphire, and (Q)uartz indicates the material used in each experiment.
Window corrections for LiF(100), -cut sapphire, and -cut quartz.
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