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Evaluation of metal-free carbon nanotubes formed by SiC thermal decomposition
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10.1063/1.2732547
/content/aip/journal/jap/101/10/10.1063/1.2732547
http://aip.metastore.ingenta.com/content/aip/journal/jap/101/10/10.1063/1.2732547
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

Cross-section transmission electron microscopy image of CNT films on SiC grown at in and for .

Image of FIG. 2.
FIG. 2.

Schematic representation of the five layer model for analyzing the SE data of CNT/SiC structures.

Image of FIG. 3.
FIG. 3.

SE measured (symbols) and fitted (solid lines) and for the CNT/SiC structures grown at for [(a) and (b) ].

Image of FIG. 4.
FIG. 4.

SE measured (symbols) and fitted (solid lines) and for the CNT/SiC structures grown at for [(a) and (b) ].

Image of FIG. 5.
FIG. 5.

The effect of growth temperature on interfacial layer thickness for the CNT/SiC structures grown at for .

Image of FIG. 6.
FIG. 6.

The volume percentages of CNTs, voids, and amorphous carbon in the CNT layer extracted from the five layer model for the CNT/SiC structures grown in for at various temperatures.

Image of FIG. 7.
FIG. 7.

The volume percentages of CNTs, voids, and amorphous carbon in the CNT layer extracted from the five layer model for the CNT/SiC structures grown in for at various temperatures.

Image of FIG. 8.
FIG. 8.

The effect of growth temperature and pressure on the CNT layer thickness determined by ellipsometry (open symbols) and corresponding thickness obtained from TEM analysis (solid symbols).

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/content/aip/journal/jap/101/10/10.1063/1.2732547
2007-05-22
2014-04-25
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Evaluation of metal-free carbon nanotubes formed by SiC thermal decomposition
http://aip.metastore.ingenta.com/content/aip/journal/jap/101/10/10.1063/1.2732547
10.1063/1.2732547
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