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diffusion in congruent crystal doped with 4.5 mol % MgO
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10.1063/1.2737354
/content/aip/journal/jap/101/11/10.1063/1.2737354
http://aip.metastore.ingenta.com/content/aip/journal/jap/101/11/10.1063/1.2737354
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

Images taken by an optical microscope from the surface of (a) as-annealed Er-22-nm crystal, (b) Er-22-nm crystal that was VTE-treated at 1125 °C over 60 h following the standard diffusion procedure, and (c) Er-30-nm crystal that was VTE-treated at 1115 °C over 50 h following the standard diffusion procedure.

Image of FIG. 2.
FIG. 2.

(a). Depth profiles of , , , and SIMS signals from Er-diffused surface of as-annealed coated with initial Er thickness of 22 nm. (b) Depth profile of SIMS signal from Er-diffused surface of as-annealed coated with initial Er thickness of 4 nm. The dot curves in (a) and (b) represent the results of fitting the measured Er profiles to a monoexponential decay functions. The fitting parameters are indicated. The surface concentrations indicated in (a) and (b) are evaluated from the respective fitted curve.

Image of FIG. 3.
FIG. 3.

Single-crystal x-ray diffraction patterns of as-annealed and -treated crystals coated with (a) 22-, (b) 30-, and (c) 40-nm-thick Er film. The reflex at the angle of 34.9° is attributed to the diffraction of the -cut substrate, while the other additional peaks to the diffractions of the phase.

Image of FIG. 4.
FIG. 4.

(a) - and (b) -polarized near infrared (1450–1650 nm) emission spectra of the as-annealed crystals coated with 4 nm (dash), 22 nm (dot), and 30 nm (thin solid-line) thick Er film. The thick solid-line on the top of each diagram shows the spectrum of the Er-30-nm crystal that was VTE treated for a relatively short duration of 22 h following the standard diffusion procedure.

Image of FIG. 5.
FIG. 5.

(a) - and (b) -polarized near infrared (1450–1650 nm) emission spectra of the crystals coated with 22 nm (dot), 30 nm (dash), and 40 nm (solid-line) thick Er film. These crystals were VTE treated for a duration of 50–60 h following the standard diffusion procedure.

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/content/aip/journal/jap/101/11/10.1063/1.2737354
2007-06-07
2014-04-23
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Er3+ diffusion in congruent LiNbO3 crystal doped with 4.5 mol % MgO
http://aip.metastore.ingenta.com/content/aip/journal/jap/101/11/10.1063/1.2737354
10.1063/1.2737354
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