LIP core formed at a firing distance is shown in front of the pressure transducer utilized for the pressure measurement (inset) and the transducer responses at the different firing distances ranging from to 15 mm at intervals of 1 mm along with the curve fit for the peaks.
Shockwave radius and its velocity corresponding to various shockwave propagation times and also different firing distances and their corresponding shockwave arrival times .
Schematic of an idealized propagating shockwave front reflecting from a substrate, indicating the LIP firing distance , shockwave radius , shockwave propagation distance , and shockwave thickness , shown for two intervals of time and .
(a) Shockwave pressure (mechanical loading) and (b) thermal (thermal loading) wave forms applied along consecutive segments on the film surface ranging from 0 to 3.5 mm with an increment of at a firing distance of 2 mm.
The geometry and boundary conditions of the chromium film-low CTE quartz substrate system with axisymmetric mesh for the finite element analysis (not to scale).
Transient temperature (K) rise along consecutive segments on the film surface ranging from 0 to 3.5 mm with an increment of at a firing distance of due to thermal loading alone.
Transient radial , axial ,and shear stresses on the film surface (a), (c), and (e) showing mechanical only while (b), (d), and (f) thermal only loading effects.
Transient radial , axial ,and shear stresses in the substrate near the film-substrate interface (a), (c), and (e) showing mechanical only while (b), (d), and (f) thermal only loading effects.
Material properties of chromium and low CTE quartz used in the FE analysis.
Dimensions and element sizes of the mesh for 100 nm Cr film and low CTE quartz substrate.
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