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Thermal loading of laser induced plasma shockwaves on thin films in nanoparticle removal
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10.1063/1.2738376
/content/aip/journal/jap/101/11/10.1063/1.2738376
http://aip.metastore.ingenta.com/content/aip/journal/jap/101/11/10.1063/1.2738376

Figures

Image of FIG. 1.
FIG. 1.

LIP core formed at a firing distance is shown in front of the pressure transducer utilized for the pressure measurement (inset) and the transducer responses at the different firing distances ranging from to 15 mm at intervals of 1 mm along with the curve fit for the peaks.

Image of FIG. 2.
FIG. 2.

Shockwave radius and its velocity corresponding to various shockwave propagation times and also different firing distances and their corresponding shockwave arrival times .

Image of FIG. 3.
FIG. 3.

Schematic of an idealized propagating shockwave front reflecting from a substrate, indicating the LIP firing distance , shockwave radius , shockwave propagation distance , and shockwave thickness , shown for two intervals of time and .

Image of FIG. 4.
FIG. 4.

(a) Shockwave pressure (mechanical loading) and (b) thermal (thermal loading) wave forms applied along consecutive segments on the film surface ranging from 0 to 3.5 mm with an increment of at a firing distance of 2 mm.

Image of FIG. 5.
FIG. 5.

The geometry and boundary conditions of the chromium film-low CTE quartz substrate system with axisymmetric mesh for the finite element analysis (not to scale).

Image of FIG. 6.
FIG. 6.

Transient temperature (K) rise along consecutive segments on the film surface ranging from 0 to 3.5 mm with an increment of at a firing distance of due to thermal loading alone.

Image of FIG. 7.
FIG. 7.

Transient radial , axial ,and shear stresses on the film surface (a), (c), and (e) showing mechanical only while (b), (d), and (f) thermal only loading effects.

Image of FIG. 8.
FIG. 8.

Transient radial , axial ,and shear stresses in the substrate near the film-substrate interface (a), (c), and (e) showing mechanical only while (b), (d), and (f) thermal only loading effects.

Tables

Generic image for table
Table I.

Material properties of chromium and low CTE quartz used in the FE analysis.

Generic image for table
Table II.

Dimensions and element sizes of the mesh for 100 nm Cr film and low CTE quartz substrate.

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/content/aip/journal/jap/101/11/10.1063/1.2738376
2007-06-11
2014-04-17
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Thermal loading of laser induced plasma shockwaves on thin films in nanoparticle removal
http://aip.metastore.ingenta.com/content/aip/journal/jap/101/11/10.1063/1.2738376
10.1063/1.2738376
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