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Optical properties of Pr thin film and nanoparticle layers during hydrogen loading and deloading
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10.1063/1.2749299
/content/aip/journal/jap/101/12/10.1063/1.2749299
http://aip.metastore.ingenta.com/content/aip/journal/jap/101/12/10.1063/1.2749299
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

Bright field TEM micrographs of Pr, (a) thin film and (b) nanoparticle layers, without Pd overlayer. Magnified images corresponds to (c) thin film and (d) nanoparticle layers. Arrows in (d) indicate two separate Pr nanoparticles. AFM micrographs of Pr, (e) thin film and (f) nanoparticle layers, without Pd overlayer.

Image of FIG. 2.
FIG. 2.

(i) X-ray diffractogram of the samples (a) TF and (b) NP in the as-deposited metallic state. X-ray diffraction (111) peak in hydrogen (c) loaded and (d) deloaded states in the samples (ii) TF and (iii) NP.

Image of FIG. 3.
FIG. 3.

Absorption coefficient spectra at hydrogenation time of 20, 30, 45, and in the samples (i) TF and (ii) NP. Curve M corresponds to the as-deposited samples.

Image of FIG. 4.
FIG. 4.

Absorption coefficient at photon energy of 1.5, 2.0, and as a function of time in the samples (i) TF and (ii) NP.

Image of FIG. 5.
FIG. 5.

Absorption edge at different hydrogen exposure time intervals (I) 20, (II) 30, (III) 45, and (IV) of the samples (i) TF and (ii) NP.

Image of FIG. 6.
FIG. 6.

Tauc’s plots for the samples (i) TF and (ii) NP in the hydrogen loaded and deloaded states.

Image of FIG. 7.
FIG. 7.

Variation of electrical resistance and absorption coefficient (at ) with hydrogen exposure time.

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/content/aip/journal/jap/101/12/10.1063/1.2749299
2007-06-27
2014-04-20
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Optical properties of Pr thin film and nanoparticle layers during hydrogen loading and deloading
http://aip.metastore.ingenta.com/content/aip/journal/jap/101/12/10.1063/1.2749299
10.1063/1.2749299
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