Bright field TEM micrographs of Pr, (a) thin film and (b) nanoparticle layers, without Pd overlayer. Magnified images corresponds to (c) thin film and (d) nanoparticle layers. Arrows in (d) indicate two separate Pr nanoparticles. AFM micrographs of Pr, (e) thin film and (f) nanoparticle layers, without Pd overlayer.
(i) X-ray diffractogram of the samples (a) TF and (b) NP in the as-deposited metallic state. X-ray diffraction (111) peak in hydrogen (c) loaded and (d) deloaded states in the samples (ii) TF and (iii) NP.
Absorption coefficient spectra at hydrogenation time of 20, 30, 45, and in the samples (i) TF and (ii) NP. Curve M corresponds to the as-deposited samples.
Absorption coefficient at photon energy of 1.5, 2.0, and as a function of time in the samples (i) TF and (ii) NP.
Absorption edge at different hydrogen exposure time intervals (I) 20, (II) 30, (III) 45, and (IV) of the samples (i) TF and (ii) NP.
Tauc’s plots for the samples (i) TF and (ii) NP in the hydrogen loaded and deloaded states.
Variation of electrical resistance and absorption coefficient (at ) with hydrogen exposure time.
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