(Color online) Experimental and calculated x-ray diffraction spectra from a multilayer grown on glass. The consistency between the spectra reveals the high quality of the multilayer. The numbers denote the order of the intensity maxima in Bragg’s equation. The intensity is measured in counts∕s.
(Color online) (a) atomic force microscopy image recorded from a multilayer grown on glass. The divisions of the and axes are , while for the axis they correspond to . (b) Log-norm distribution diagram for the grain size, evaluated with the help of the image.
(Color online) Polar Kerr rotation spectra for six multilayers, as indicated. All samples have been grown on high quality glass substrates. A spectrum from a thick nickel film is also plotted in (a) as a reference.
(Color online) Simulation curves (lines) of the measured Kerr spectra (open tetragonal) of (a) sample and (b) sample grown on glass substrates. Calculation 1 considers the multilayer structure as it is and calculation 2 refers to the same multilayer but without the protective Pt overlayer.
(Color online) Magneto-optic polar Kerr rotation loops for six multilayers, as indicated. All samples have been grown on high quality glass substrates.
(Color online) Magnetization curve for (a) the and (b) multilayers recorded with the help of the polar Kerr effect. The experimental data have been multiplied by for better overview. The calculated curves have been produced by only taking into account the shape anisotropy and the Zeeman term (calculated 1) or all terms of Eq. (3) (calculated 2).
Magneto-optic data for a series of multilayers as indicated. The calculated maximum Kerr rotation is derived from calculation 2, where the Pt overlayer is excluded.
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