XRD spectra of sample after five-pulsed laser annealing for both as-deposited and annealed samples.
XTEM bright field micrograph of sample after five-pulsed laser annealing at with the inset showing the SAED pattern of the crystalline layer.
XRD spectra of sample after 20-pulsed laser annealing for both as-deposited and annealed samples.
Bright field XTEM micrographs of sample after 20-pulsed laser annealing at (a) and (b) . The insets show the SAED pattern obtained from various conditions shown in (a) and (b).
Sheet resistance value of the sample after 20-pulsed laser annealing at different laser fluences . The sheet resistances of the samples are normalized to that of the as-deposited (as-dep) sample.
The diffuse surface reflectance (obtained from UV-visible measurement at laser wavelength) of the sample after laser annealing at different laser pulses. The reflectance values were taken for the as-deposited sample and after 1-pulsed, 5-pulsed, and 20-pulsed laser annealings which were labeled as 0, 1, 5, and 20 in the axis.
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