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Cross-plane Seebeck coefficient of superlattices
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10.1063/1.2433751
/content/aip/journal/jap/101/3/10.1063/1.2433751
http://aip.metastore.ingenta.com/content/aip/journal/jap/101/3/10.1063/1.2433751
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

(Color online) The diagram of the test pattern device structure: (a) integrated microheaters on top of the superlattice mesa and (b) integrated microheaters on the InP substrate.

Image of FIG. 2.
FIG. 2.

The combined Seebeck coefficients for the four superlattice samples and the Seebeck coefficients of their InP substrates were measured using device test patterns.

Image of FIG. 3.
FIG. 3.

The lapped InP substrates of the four superlattice samples were measured for the calibration of the results measured using device test patterns, and the Seebeck coefficients were obtained from the slope of the linear fit of the measured vs .

Image of FIG. 4.
FIG. 4.

Measurement results of the cross-plane and in-plane Seebeck coefficients for the two sets of eight superlattice samples.

Image of FIG. 5.
FIG. 5.

Calculation results of the energy difference of for the well and barrier of superlattice with different carrier concentrations.

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/content/aip/journal/jap/101/3/10.1063/1.2433751
2007-02-06
2014-04-20
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Cross-plane Seebeck coefficient of ErAs:InGaAs∕InGaAlAs superlattices
http://aip.metastore.ingenta.com/content/aip/journal/jap/101/3/10.1063/1.2433751
10.1063/1.2433751
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