(Color online) The diagram of the test pattern device structure: (a) integrated microheaters on top of the superlattice mesa and (b) integrated microheaters on the InP substrate.
The combined Seebeck coefficients for the four superlattice samples and the Seebeck coefficients of their InP substrates were measured using device test patterns.
The lapped InP substrates of the four superlattice samples were measured for the calibration of the results measured using device test patterns, and the Seebeck coefficients were obtained from the slope of the linear fit of the measured vs .
Measurement results of the cross-plane and in-plane Seebeck coefficients for the two sets of eight superlattice samples.
Calculation results of the energy difference of for the well and barrier of superlattice with different carrier concentrations.
Article metrics loading...
Full text loading...