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Quantitative structural characterization of GaN quantum dot ripening using reflection high-energy electron diffraction
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10.1063/1.2422902
/content/aip/journal/jap/101/5/10.1063/1.2422902
http://aip.metastore.ingenta.com/content/aip/journal/jap/101/5/10.1063/1.2422902
/content/aip/journal/jap/101/5/10.1063/1.2422902
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/content/aip/journal/jap/101/5/10.1063/1.2422902
2007-03-09
2014-10-25
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Quantitative structural characterization of GaN quantum dot ripening using reflection high-energy electron diffraction
http://aip.metastore.ingenta.com/content/aip/journal/jap/101/5/10.1063/1.2422902
10.1063/1.2422902
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