XRD pattern of the sputtered ZnO film on the silicon substrate. The inset is the cross-sectional FE-SEM image of the sputtered ZnO film.
(Color online) (a) PL spectrum of the sputtered ZnO film excited by a He–Cd laser operating at , (b) EL spectra of the heterojunction under the forward bias voltage of (red line) and (black line), and (c) EL spectra of the heterojunction under the reverse bias voltages of (red line) and (black line).
characteristics of the (a) and (b) heterojunctions. The inset in (a) shows the charateristics of contact.
Schematic energy band diagrams of heterojunction under zero bias (a), and heterojunction under zero bias (b) and appropriately large reverse bias (c).
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