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Analysis of vertical alignment and bending of crystalline nanowires using normal and grazing incidence x-ray diffraction intensities
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10.1063/1.2435076
/content/aip/journal/jap/101/6/10.1063/1.2435076
http://aip.metastore.ingenta.com/content/aip/journal/jap/101/6/10.1063/1.2435076
/content/aip/journal/jap/101/6/10.1063/1.2435076
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/content/aip/journal/jap/101/6/10.1063/1.2435076
2007-03-21
2014-11-26
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Analysis of vertical alignment and bending of crystalline α-Fe2O3 nanowires using normal and grazing incidence x-ray diffraction intensities
http://aip.metastore.ingenta.com/content/aip/journal/jap/101/6/10.1063/1.2435076
10.1063/1.2435076
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