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Field dependent alternating current susceptibility of metalorganically deposited films
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10.1063/1.2713938
/content/aip/journal/jap/101/7/10.1063/1.2713938
http://aip.metastore.ingenta.com/content/aip/journal/jap/101/7/10.1063/1.2713938

Figures

Image of FIG. 1.
FIG. 1.

and measured at 77 K as functions of ac field amplitude and frequency . Plots (a), (b), (c), and (d) are for films A, B, C, and D, respectively.

Image of FIG. 2.
FIG. 2.

Reduced resistance as a function of temperature for films A (YBCO-Au-LAO), B (YBCO-BST-LAO), and C (YBCO-LAO).

Image of FIG. 3.
FIG. 3.

Room-temperature Raman spectra for films A, B, and C at several spots. Both incident and scattering light polarizations are parallel to an edge of the film.

Image of FIG. 4.
FIG. 4.

SEM pictures for films A [(a), (b)], B [(c) ,(d)], C (e), and D (f).

Image of FIG. 5.
FIG. 5.

The -scan x-ray diffraction pattern of film A.

Image of FIG. 6.
FIG. 6.

Perpendicular and as functions of normalized field amplitude , and being the critical-current density and thickness, for a thin disk and a thin strip calculated from the Bean model.

Image of FIG. 7.
FIG. 7.

For the perpendicular ac susceptibility of a thin disk of radius and thickness obeying the power-law , the maximum , , the at which occurs, , and the field amplitude at which occurs, , normalized to their Bean values as functions of . For the last quantity, dimensionless frequency is set.

Image of FIG. 8.
FIG. 8.

The calculated longitudinal and of a long cylinder of radius obeying the flux-flow , Eqs. (5) and (6), with critical-current density as functions of normalized field amplitude and dimensionless frequency . Arrows indicate the direction of increasing frequency. Dashed lines show results of the Bean model.

Image of FIG. 9.
FIG. 9.

The calculated longitudinal and of a long cylinder of radius obeying the Kim–Anderson type of exponential , Eq. (8), connecting to a low linear with critical-current density as functions of normalized field amplitude and frequency. Three cases (a), (b), and (c) correspond to , 5, and 10, respectively. The relevant current-voltage characteristic is shown in (b) and (c). Arrows indicate the direction of increasing frequency.

Image of FIG. 10.
FIG. 10.

and measured at 77 K as functions of ac field amplitude at 2430 Hz for a YBCO film before and after scratching. The scratched configurations are shown by the squares with divisions.

Image of FIG. 11.
FIG. 11.

(a) and measured at 77 K as functions of ac field amplitude and frequency for film D. (b) The and determination from the measured for film D. Arrows in (a) indicate the direction of increasing frequency.

Tables

Generic image for table
Table I.

Characteristic quantities for perpendicular ac susceptibility of thin strip of width and thickness and thin disk of radius and thickness calculated from the Bean model.

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/content/aip/journal/jap/101/7/10.1063/1.2713938
2007-04-05
2014-04-19
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Field dependent alternating current susceptibility of metalorganically deposited YBa2Cu3O7−δ films
http://aip.metastore.ingenta.com/content/aip/journal/jap/101/7/10.1063/1.2713938
10.1063/1.2713938
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