Room-temperature stress-strain curves for AgMg sheathed tape. Young’s modulus is , yield stress is (based on 0.2% offset) and yield strain of 0.349%.
The regression lines obtained during calculation of the Weibull parameters from data with , 0.25%, and 0.349%. represents the slope of the regression lines for each strain value, is the offset value subtracted from each data to maximize the linear relationship of the regression line, and is a measure of distribution of the data in the Weibull distribution.
The Weibull distributions obtained from data with , 0.25%, and 0.349%. The location parameters are the current values below which there is 100% reliability. These values decrease with increasing strain, as expected, and becomes zero at the yield strain.
The regression line obtained when estimating Weibull parameters from yield stress data for AgMg sheathed tape.
Weibull reliability distribution for stress for the AgMg sheathed tape. The distribution shows the fraction of samples that have not yet yielded as defined by the 0.2% yield stress.
The data from Fig. 3 are replotted here by shifting each curve to the right by its corresponding value. Thus, these are plots of reliability vs for , 0.25%, and 0.349%.
, , and values from data as a function of applied uniaxial strain applied to the samples prior to measurements.
Results for replication tests on the AgMg sheathed tapes. The yield stress values are obtained by the 0.2% offset method and correspond to 0.349% strain. All critical current values were obtained at , self-field using the four-point method with a electric field criterion.
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