(Color online) AFM Images of sample (a) before and (b) after 1 h of light soaking. The surface topography changes after light soaking.
Fluctuating band picture of amorphous silicon films. The inhomogeneous distribution of hydrogen causes a variation in local band gap in these films.
rms surface roughness of : H films (scan area ) in the annealed state and after 1 h of light soaking as deduced from the analysis of AFM images.
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