XRD patterns of (a) and (b) . The inset of (b) showed the x-ray in-plane scans.
Hysteresis loops, measured at , of (0002) textured films deposited at different oxygen flow rates.
Magnetoresistance of (0002) textured films, measured at , deposited at different oxygen flow rates.
Dark-field TEM images of epitaxial taken from (a) and (b) diffraction patterns. SAD patterns taken from (c) A grain (zone axis ) and (d) B grain (zone axis ). The direction of electron beam is along Cu . (e) The schematic diagram of crystalline orientations.
Hysteresis loop of epitaxial (0002) films measured at .
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