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Microstructures of SiC nanoparticle-doped tapes
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10.1063/1.2750409
/content/aip/journal/jap/102/1/10.1063/1.2750409
http://aip.metastore.ingenta.com/content/aip/journal/jap/102/1/10.1063/1.2750409

Figures

Image of FIG. 1.
FIG. 1.

(Color online) Width of the resistive transitions as a function of reaction temperature and doping level for the entire sample set.

Image of FIG. 2.
FIG. 2.

(a) Upper critical magnetic field for the samples investigated by TEM. (b) The transition breadth as a function of temperature for the and -pure samples (has been previously published in Ref. 7).

Image of FIG. 3.
FIG. 3.

(Color online) (a) BF and (b) DF TEM images of the sample. The DF image is formed with an aperture centered on part of the diffraction ring. (c) Grain size distributions for the samples, measured from TEM DF images similar to (b).

Image of FIG. 4.
FIG. 4.

TEM results from the samples. (a) A SAD pattern from the 10%SiC sample with the MgO {111} diffraction ring indicated. (b) A BF TEM image of the 10%SiC sample with a large single crystal grain at the center. The inset shows the [110] SAD pattern of that grain. (c) A SAD pattern from the -pure sample showing no MgO.

Image of FIG. 5.
FIG. 5.

-contrast image taken from sample. Bright regions in this image are heavy (high atomic number) phases such as MgO and . Dark regions are light phases including and .

Image of FIG. 6.
FIG. 6.

-contrast image taken from sample and the B, C, and O elemental distributions from an EELS line scan along the line in the image. EELS spectra were acquired every .

Image of FIG. 7.
FIG. 7.

(Color online) EDS elemental map of the sample. (a) A -contrast image with a domain at the center and Si, Mg, C, and O maps of the same region.

Image of FIG. 8.
FIG. 8.

(Color online) EDS elemental map of the sample. (a) A -contrast image with a second phase domain at the center and Si, Mg, C, and O maps of the same region.

Image of FIG. 9.
FIG. 9.

(Color online) (a) -contrast image taken from sample and the B, C, and O elemental distributions derived from an EELS line scan along the line in the image. EEL spectra were acquired every . (b) Si, Mg, and O EDS elemental maps of the same region.

Image of FIG. 10.
FIG. 10.

Background-subtracted EEL spectra of the Si edge of two different areas of the sample. The upper spectrum shows fine structure and a core-level shift typical of , and the lower spectrum is typical of . The inset shows the O edge from the same two regions.

Tables

Generic image for table
Table I.

, RRR, and connectivity data for all samples.

Generic image for table
Table II.

Grain size measurement.

Generic image for table
Table III.

-contrast intensity for various phases relative to the intensity of .

Generic image for table
Table IV.

Second phases identified in tapes.

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/content/aip/journal/jap/102/1/10.1063/1.2750409
2007-07-11
2014-04-25
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Microstructures of SiC nanoparticle-doped MgB2∕Fe tapes
http://aip.metastore.ingenta.com/content/aip/journal/jap/102/1/10.1063/1.2750409
10.1063/1.2750409
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