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Low-frequency noise of -glass thick resistive films
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10.1063/1.2815677
/content/aip/journal/jap/102/10/10.1063/1.2815677
http://aip.metastore.ingenta.com/content/aip/journal/jap/102/10/10.1063/1.2815677
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

TEM picture of the film made of the paste containing of .

Image of FIG. 2.
FIG. 2.

(Color online) Resistance vs temperature for the S samples , 0.12, and 0.16.

Image of FIG. 3.
FIG. 3.

(Color online) Noise magnitude (open circles), voltage (filled circles), and film thickness (squares) vs relative distance for L samples: #108 and #111 with Au terminations measured at . The voltage across the whole sample was . Lines are: the graph of Eq. (1) (solid, upper panel), and the function: (dashed, lower panel).

Image of FIG. 4.
FIG. 4.

(Color online) Power spectral densities of excess noise measured at for several voltages biasing a pair of S samples.

Image of FIG. 5.
FIG. 5.

(Color online) Dependence of noise magnitude on voltage at selected temperatures measured for samples . Dashed line has the slope of 2. Averaging was over the band .

Image of FIG. 6.
FIG. 6.

(Color online) Normalized noise as a function of temperature. Filled and empty symbols for series refer to two measurement sessions (performed with six month delay) with different values of load resistance . Line drawn through data has the slope . Dashed–dotted line is the plot of .

Image of FIG. 7.
FIG. 7.

(Color online) Normalized noise as a function of magnetic field at selected temperatures measured for samples and 0.16.

Image of FIG. 8.
FIG. 8.

(Color online) Sample maps of vs frequency and reciprocal temperature measured with dc technique for samples #102, #103 (, PtAu contacts) in two experimental runs.

Image of FIG. 9.
FIG. 9.

(Color online) Normalized excess noise (left-hand axis) and resistance (right-hand axis) vs temperature measured with dc (small points) or ac (large circles) bias for samples #102 and #103. Line is the function graph of . dc measurements were performed for three different voltages 40, 60, and 100 V across the measurement bridge. Voltage across the samples changes during experiment and was in the range , , and , respectively.

Image of FIG. 10.
FIG. 10.

(Color online) Noise exponent calculated from spectral slope (points) at compared with the values calculated from temperature dependence of noise (lines) through rhs of Eq. (2) (thin solid) and activation energies (most right), 0.13, and 0.06 eV (most left) or Eq. (3) (thick solid) or Eq. (5) (dashed).

Image of FIG. 11.
FIG. 11.

(Color online) Data from Figs. 9 and 6 for films (squares) and (circles) redrawn as vs . Lines show the fit with percolation power law.

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/content/aip/journal/jap/102/10/10.1063/1.2815677
2007-11-29
2014-04-18
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Low-frequency 1/f noise of RuO2-glass thick resistive films
http://aip.metastore.ingenta.com/content/aip/journal/jap/102/10/10.1063/1.2815677
10.1063/1.2815677
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