(Color online) (a) Omni-AR coating based on monolayer of spherical particles and SOG film. (b) Scanning electron micrographs of fabricated omni-AR coatings: (i) top view; (ii) cross-sectional view before SOG film, and (iii) cross-sectional view after SOG film.
(Color online) A hemispherical grating as the basic anti-reflection structure for simulation: (a) three-dimensional view of the square lattice; (b) top view, and (c) cross-sectional view of the basic structure.
(Color online) (a) Crystal silicon complex index dispersion curve from ultraviolet to infrared and (b) refractive index dispersion curve of silicon and silicon dioxide used in our simulation.
(Color online) Simulated quarter wavelength multilayer thin film AR structures with ideal indices and thicknesses for (a) single and (b) triple layers.
(Color online) Simulation results for hemispherical structures with index on silicon substrate: (a) square lattice hemispherical structure with radius and lattice constant and (b) omni-AR structure with hemispherical structure on top of a thin film with the same index and thickness .
(Color online) (a) Simulation results for omni-AR structure on Si substrate with a thin film in between ( and ); other simulation parameters are the same as those in Fig. 5(b). The reflectivity for (b) small incident angles ( and ) and (c) large incident angles ( and ) for two cases: coated Si and omni-AR on coated Si.
(Color online) Packing density impact for the proposed hemispherical omni-AR structure similar to the one in Fig. 6(a) with , , and lattice constant (a) and (b) . (c) Surface normal reflectivity for different packing densities.
(Color online) Spherical radius impact for the proposed hemispherical omni-AR structure similar to the one in Fig. 6(a) with , , and spherical radius (a) and (b) . (c) Surface normal reflectivity and (d) large incident angle reflectivity for different spherical radius.
(Color online) The structures and simulation results for three differently shaped structures: (a) pyramids, (b) cones, and (c) hemispheres. Both loosely packed and close-packed structures are simulated for comparison.
(Color online) Reflectivity simulation results for index matching of silica omni-AR to Si substrate: (a) film with a fixed index of 2.0 and (b) graded index film with index varying linearly from omni-AR to substrate .
(Color online) Reflectivity simulation results for graded index omni-AR structures on high index Si substrate: (a) index profile from air to film below and (b) ideal index matching from air to Si substrate ( varying from air to Si ).
(Color online) Total transmissivity under normal incidence of quartz wafers with various surface coatings.
(Color online) (a) Angle-dependent transmissivity of a quartz wafer before and after an omni-AR coating and (b) schematic of experimental setup for angle dependent total transmissivity measurement.
(Color online) Simulated transmissivity at different incident angles for quartz wafers with and without an omni-AR coating.
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