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Spatial, energy, and time-dependent study of surface charging using spectroscopy and microscopy techniques
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10.1063/1.2817915
/content/aip/journal/jap/102/11/10.1063/1.2817915
http://aip.metastore.ingenta.com/content/aip/journal/jap/102/11/10.1063/1.2817915
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

PES spectra recorded at 1486.6 eV on a 10 nm thick layer of grown on . Note how a higher level of noise affects the convoluted peaks with respect to the counterpart. The spectrum shown is the result of two summed scan (300 s per scan) with no average procedure applied. A model picture of the probe depth and of the IMFP at the same photon energy is also presented

Image of FIG. 2.
FIG. 2.

PES spectra recorded at 110 and 130 eV, corresponding to bulk and surface-sensitive mode, respectively. The spectra shown have been recorded summing up two scan (300 s per scan) with no average filtering. A model picture for the probe depths and IMFP at these photon energies shows the difference between the two cases.

Image of FIG. 3.
FIG. 3.

Sequence of conducting-tip AFM images of ITO taken at an acquisition time of about 30 s with a 5 V voltage applied between tip and sample. A change in the surface conductivity is evident, on the time scale of minutes.

Image of FIG. 4.
FIG. 4.

(Color online) Sequence of video frames (1–6) taken on CsI. The field of view is . The contrast is time changing, indicating the presence of processes other than spatial inhomogeneities.

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/content/aip/journal/jap/102/11/10.1063/1.2817915
2007-12-06
2014-04-20
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Spatial, energy, and time-dependent study of surface charging using spectroscopy and microscopy techniques
http://aip.metastore.ingenta.com/content/aip/journal/jap/102/11/10.1063/1.2817915
10.1063/1.2817915
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