PES spectra recorded at 1486.6 eV on a 10 nm thick layer of grown on . Note how a higher level of noise affects the convoluted peaks with respect to the counterpart. The spectrum shown is the result of two summed scan (300 s per scan) with no average procedure applied. A model picture of the probe depth and of the IMFP at the same photon energy is also presented
PES spectra recorded at 110 and 130 eV, corresponding to bulk and surface-sensitive mode, respectively. The spectra shown have been recorded summing up two scan (300 s per scan) with no average filtering. A model picture for the probe depths and IMFP at these photon energies shows the difference between the two cases.
Sequence of conducting-tip AFM images of ITO taken at an acquisition time of about 30 s with a 5 V voltage applied between tip and sample. A change in the surface conductivity is evident, on the time scale of minutes.
(Color online) Sequence of video frames (1–6) taken on CsI. The field of view is . The contrast is time changing, indicating the presence of processes other than spatial inhomogeneities.
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