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Cross-sectional scanning tunneling microscopy of biased semiconductor lasers
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10.1063/1.2757006
/content/aip/journal/jap/102/2/10.1063/1.2757006
http://aip.metastore.ingenta.com/content/aip/journal/jap/102/2/10.1063/1.2757006
/content/aip/journal/jap/102/2/10.1063/1.2757006
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/content/aip/journal/jap/102/2/10.1063/1.2757006
2007-07-19
2014-08-29
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Cross-sectional scanning tunneling microscopy of biased semiconductor lasers
http://aip.metastore.ingenta.com/content/aip/journal/jap/102/2/10.1063/1.2757006
10.1063/1.2757006
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